Growing community of inventors

Redmond, WA, United States of America

Dahai Yu

Average Co-Inventor Count = 2.51

ph-index = 8

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 174

Dahai YuEric Yeh-Wei Tseo (5 patents)Dahai YuBarry Saylor (4 patents)Dahai YuRyan Northrup (4 patents)Dahai YuBart De Vlieghere (3 patents)Dahai YuRichard M Wasserman (2 patents)Dahai YuMichael Nahum (1 patent)Dahai YuKim W Atherton (1 patent)Dahai YuAkira Takada (1 patent)Dahai YuGyokubu Cho (1 patent)Dahai YuAna M Tessadro (1 patent)Dahai YuHirato Sonobe (1 patent)Dahai YuKareem G Fawell (1 patent)Dahai YuMatthew Buza (1 patent)Dahai YuCharles Blanford (1 patent)Dahai YuThomas Moch (1 patent)Dahai YuKai Kircher (1 patent)Dahai YuMichael Peter (1 patent)Dahai YuBrenan N Kelley (1 patent)Dahai YuGary Olson (1 patent)Dahai YuBarry E Saylor (0 patent)Dahai YuDahai Yu (17 patents)Eric Yeh-Wei TseoEric Yeh-Wei Tseo (6 patents)Barry SaylorBarry Saylor (10 patents)Ryan NorthrupRyan Northrup (7 patents)Bart De VlieghereBart De Vlieghere (3 patents)Richard M WassermanRichard M Wasserman (9 patents)Michael NahumMichael Nahum (47 patents)Kim W AthertonKim W Atherton (32 patents)Akira TakadaAkira Takada (25 patents)Gyokubu ChoGyokubu Cho (15 patents)Ana M TessadroAna M Tessadro (6 patents)Hirato SonobeHirato Sonobe (3 patents)Kareem G FawellKareem G Fawell (1 patent)Matthew BuzaMatthew Buza (1 patent)Charles BlanfordCharles Blanford (1 patent)Thomas MochThomas Moch (1 patent)Kai KircherKai Kircher (1 patent)Michael PeterMichael Peter (1 patent)Brenan N KelleyBrenan N Kelley (1 patent)Gary OlsonGary Olson (1 patent)Barry E SaylorBarry E Saylor (0 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Mitutoyo Corporation (17 from 1,622 patents)

2. Mitutoyo Europe Gmbh (4 from 8 patents)

3. Mitutoro Europe Gmbh (1 from 1 patent)


17 patents:

1. 11860602 - Inspection program editing environment with automatic transparency operations for occluded workpiece features

2. 10254113 - Inspection program editing environment providing user defined collision avoidance volumes

3. 9976852 - Inspection program editing environment providing user defined collision avoidance volumes with integral modification properties

4. 9952586 - Inspection program editing environment with simulation status and control continually responsive to selection operations

5. 9933256 - Inspection program editing environment including real-time feedback related to throughput

6. 9646425 - Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions

7. 9639083 - System and method for programming workpiece feature inspection operations for a coordinate measuring machine

8. 9444995 - System and method for controlling a tracking autofocus (TAF) sensor in a machine vision inspection system

9. 9223306 - System and method utilizing an editing initialization block in a part program editing environment in a machine vision system

10. 8957960 - Machine vision system program editing environment including real time context generation features

11. 8271895 - GUI for programming step and repeat operations in a machine vision inspection system

12. 7627162 - Enhanced video metrology tool

13. 7570795 - Multi-region autofocus tool and mode

14. 7333219 - Handheld metrology imaging system and method

15. 7120286 - Method and apparatus for three dimensional edge tracing with Z height adjustment

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12/29/2025
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