Stats Chippac Pte. Ltd.

DaeWook Yang

KyungHoon Lee

MinJung Kim

SunMi Kim

Yeongbeom Ko

SeungWon Kim

Hun Teak Lee

Tae Keun Lee

Youngcheol Kim

An integrated circuit packaging system, and a method of manufacture thereof, including: a device formed as a die having a conductor with ends exposed on opposite sides of the die; a first surface depression on the device, the first surface depression surrounding one of the ends of the conductor exposed at a stack side of the die; a first component over and connected to the conductor, the first component surrounded by the first surface depression; and a first underfill between and in direct contact with the first component and the device, the first underfill substantially filled to a side of an inner edge and within a perimeter of the first surface depression isolated from the conductor.

Integrated circuit packaging system with underfill and method of manufacture thereof

An integrated circuit package system includes: providing a substrate; forming a conductive layer over the substrate; forming a mold gate layer having an organic material without polymerization over the conductive layer; and attaching an integrated circuit over the substrate adjacent the mold gate layer.

Integrated circuit package system with mold gate

A semiconductor device has a substrate with a plurality of conductive vias formed through the substrate and conductive layer formed over the substrate. A first encapsulant is deposited over the substrate outside a die attach area of the substrate. The first encapsulant surrounds each die attach area over the substrate and the die attach area is devoid of the first encapsulant. A channel connecting adjacent die attach areas is also devoid of the first encapsulant. A first semiconductor die is mounted over the substrate within the die attach area after forming the first encapsulant. A second semiconductor die is mounted over the first die within the die attach area. An underfill material can be deposited under the first and second die. A second encapsulant is deposited over the first and second die and first encapsulant. The first encapsulant reduces warpage of the substrate during die mounting.

Semiconductor device and method of forming pre-molded substrate to reduce warpage during die molding

A method of manufacture of an integrated circuit packaging system includes: providing a circuit substrate having an active side opposite to an inactive portion; attaching a nonconductive cover to the active side; forming a separation-gap partially cutting into the nonconductive cover and the circuit substrate to a kerf depth; attaching a back-grinding tape to the nonconductive cover; removing a portion of the inactive portion; and exposing the nonconductive cover by removing the back-grinding tape.

Integrated circuit packaging system with ultra-thin chip and method of manufacture thereof

A method of manufacture of an integrated circuit packaging system includes: forming an integrated circuit device having a device contact surface, a device lateral side, and a device backside opposite the device contact surface; forming a device shell, having a shell lip, contiguous with the device backside and the device lateral side, the shell lip adjacent to and coplanar with the device contact surface; attaching a substrate to the integrated circuit device, the device shell between the integrated circuit device and the substrate; and forming an encapsulation on the substrate and covering the integrated circuit device and the device shell.

Integrated circuit packaging system with an encapsulation and method of manufacture thereof

A method of manufacture of an integrated circuit packaging system includes: providing a device having a conductor with ends exposed on opposite sides of the device; forming a first surface depression on the device around the conductor; connecting a first component over the conductor and surrounded by the first surface depression; and applying a first underfill between the first component and the device, the first underfill substantially filled within a perimeter of the first surface depression.

Growing community of inventors

Yongin-si, South Korea

DaeWook Yang