Samsung Electronics Co., Ltd.

Dae Seo Park

Oh Seok Kwon

Jong Tae Kim

Won Soo Ji

Choo Ho Kim

Ka Ram Lee

Jumyong Park

Woon Chun Kim

Song Ho Jeong

Dae Gwan Kim

A semiconductor device includes a lower structure and an upper structure on the lower structure. The lower structure includes a first semiconductor substrate, a first pad and a first dielectric layer. The first dielectric layer surrounds the first pad and exposes a top surface of the first pad. The upper structure includes a second semiconductor substrate, a second pad and a second dielectric layer. The second dielectric layer surrounds the second pad and exposes a bottom surface of the second pad. The first pad and the second pad are bonded to each other across an interfacial layer to couple the upper and lower structures to each other. The first and second pads and the interfacial layer include a same metallic material. The first and second pads have a substantially same average grain size and the interfacial layer has a different average grain size than the first and second pads.

Semiconductor device and method of fabricating the same

A test apparatus includes a lighting unit radiating light on a to-be-tested object having a light transmitting resin containing a light conversion material; a camera unit obtaining an image of the to-be-tested object while the light transmitting resin is emitted by receiving light emitted by the lighting unit; and a controller determining whether the to-be-tested object is defective by calculating gray values from the image obtained by the camera unit.

Test apparatus and manufacturing apparatus of light emitting device package

Manufacturing a light source module may include mounting light emitting devices on substrates on an upper surface of a carrier, mounting optical devices to cover the light emitting devices, and inspecting the light emitting devices and the optical devices based on selectively capturing images thereof. Images may be captured based on controlling a light source module scanner assembly on the carrier. The substrates may extend in a first direction and may be spaced apart in a second direction. Controlling the light source module scanner assembly may include moving the light source module scanner assembly along a selected direction to position the light source module scanner assembly on at least one of the light emitting devices and the optical devices. The direction may be selected based on the quantity of substrates and the quantity of light emitting devices and optical devices on each of the substrates.

Methods of manufacturing light source module

A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.

Method of inspecting a light source module for defects, method of manufacturing a light source module, and apparatus for inspecting a light source module

An apparatus for measurement of a three-dimensional (3D) shape includes a lens unit transmitting slit beams to a plurality of measurement objects, a light source unit irradiating the plurality of slit beams to the lens unit at different angles, an imaging unit obtaining images of the plurality of measurement objects formed by the slit beams irradiated on the plurality of measurement objects, and a calculation processing unit generating information regarding a 3D shape of the plurality of measurement objects from the images obtained by the imaging unit.

Growing community of inventors

Suwon-si, South Korea

Dae Seo Park