Okins Electronics Co., Ltd.

Dae Joong Yoon

Hyung Il Jeon

Young Hoon Kim

Jin Kook Jun

Young Ryong Yoon

Myung Gi Seo

Young Shik Park

An inspecting method using an electro-optical detecting device is disclosed. The electro-optical detecting device includes: an upper substrate and a lower substrate; a nematic liquid crystal layer interposed between the upper substrate and the lower substrate; a transparent electrode interposed between the nematic liquid crystal layer and the upper substrate, the transparent electrode connected to a device under test (DUT) via a power supply; a polarizing plate located over the nematic liquid crystal layer; and a reflecting plate located under the nematic liquid crystal layer. A method using the electro-optical detecting device includes applying a voltage between the transparent electrode and the DUT to generate an electric field across the liquid crystal layer; illuminating the detector and capturing an image of the detector using the light reflected from the detector; and determining the DUT has some defects from the image of the detector by an abnormal electric field generated between the transparent electrode and the DUT.

Growing community of inventors

Icheon-si, South Korea

Dae Joong Yoon