Samsung Electronics Co., Ltd.

Lg Semicon Co., Ltd.

Smart Power Solutions, Inc.

Dae-Jeong Kim

Insu Choi

Wonjae Shin

Yongjun Yu

Sung-Joon Kim

Do-Han Kim

Nam Hyung Kim

Changmin Lee

Tae-Kyeong Ko

Deokho Seo

Minsu Kim

Chanik Park

Kwang-woo Lee

Heon Gwon Lee

Wooseop Kim

Min Su Kim

Kwang-il Park

Sang-jin Park

Seung-Jun Lee

Chul-woo Park

Young-Soo Sohn

Ho-Young Reho Lee

Wan-jun Park

Tae-wan Kim

Won Jae Shin

Sang-Min Kim

Kwanghee Lee

Jae-Youn Youn

Tae-Wan Kim

Su-a Kim

Dae-Young Youn

Hyung-soon Shin

Hyun-Sung Shin

Sang-Jin Park

Chang Min Lee

Ik-Joon Choi

Do-han Kim

Yong Jun Yu

Il Gyu Jung

In Su Choi

Dae-Sun Kim

Jongyoung Lee

Jiseok Kang

Deok Ho Seo

Youn-Cherl Shin

Hui-Chung Byun

Hun-June Kim

Sung-Min Ryu

Hoon-Chang Yang

Kabyong Kim

Inho Cho

Yoenhwa Lee

Wan-Jun Park

Seung-Jun Dep Of Information Electronics Lee

Hyung-Soon Depof Information Electronics Shin

An operation method of a memory controller, which is configured to control a memory module including a plurality of memory devices and at least one error correction code (ECC) device, is provided. The method includes reading a data set including user data stored in the plurality of memory devices and ECC data stored in the at least one ECC device, based on a read command and a first address, and writing uncorrectable data in a memory area, which is included in each of the plurality of memory devices and the at least one ECC device and corresponds to the first address, when an error of the user data is not corrected based on the ECC data.

Operation method of memory module, operation method of memory controller, and operation method of memory system

An operation method of a memory device, having a plurality of memory cells, includes receiving a partial write command, which includes a partial write enable signal (PWE) and a plurality of mask signals, during a command/address input interval. A data strobe signal is received through a data strobe line after receiving the partial write command Data is received through a plurality of data lines in synchronization with the data strobe signal during a data input interval. A part of the data is stored in the plurality of memory cells based on the plurality of mask signals, in response to the partial write enable signal, during a data write interval.

Electronic device, operation method of host, operation method of memory module, and operation method of memory device

A memory module includes a memory device configured to receive a first refresh command from a host, and perform a refresh operation in response to the first refresh command during a refresh time, and a computing unit configured to detect the first refresh command provided from the host to the memory device, and write a first error pattern at a first address of the memory device during the refresh time.

Memory module and operating method

A method for accessing a memory module includes; encoding first data of a first partial burst length to generate first parities and first cyclic redundancy codes, encoding second data of a second partial burst length to generate second parities and second cyclic redundancy codes, writing the first data and the second data to first memory devices, and writing the first parities, the first cyclic redundancy codes, the second parities, and the second cyclic redundancy codes to a second memory device and a third memory device.

Method for accessing semiconductor memory module

Memory systems include a first semiconductor memory module and a processor. The processor is configured to access the first semiconductor memory module by units of a page, and further configured to respond to an occurrence of a page fault in a specific page, which is associated with a virtual address corresponding to an access target, by adjusting a number of pages and allocating pages in the first semiconductor memory module corresponding to the adjusted number of the pages, which are associated with the virtual address.

Memory systems having semiconductor memory modules therein that support page fault processing

A memory device includes a peripheral circuit communicating with memory banks. Each of the banks includes a memory cell array including memory cells, a row decoder connected with the memory cells through word lines, bit line sense amplifiers connected with the memory cells through bit lines including first bit lines and second bit lines, and a column decoder configured to connect the bit line sense amplifiers with the peripheral circuit. The memory cell array includes a first section connected with the first bit lines and a second section connected with the second bit lines, and the first section and second section are independent of each other with regard to a row-dependent error.

Memory device and memory module including same

A memory system includes a nonvolatile memory module and a first controller configured to control the nonvolatile memory module. The nonvolatile memory module includes a volatile memory device, a nonvolatile memory device, and a second controller configured to control the volatile memory device and the nonvolatile memory device. The first controller may be configured to transmit a read request to the second controller. When, during a read operation according to the read request, normal data is not received from the nonvolatile memory device, the first controller may perform one or more retransmits of the read request to the second controller without a limitation on a number of times that the first controller performs the one or more retransmits of the read request.

Memory system including memory module, memory module, and operating method of memory module

A memory system includes a processor that includes cores and a memory controller, and a first semiconductor memory module that communicates with the memory controller. The cores receive a call to perform a first exception handling in response to detection of a first error when the memory controller reads first data from the first semiconductor memory module. A first monarchy core of the cores performs the first exception handling and the remaining cores of the cores return to remaining operations previously performed.

Memory systems and operating methods of memory systems

According to an exemplary embodiment, a memory device may include a memory cell array that includes memory cells connected to word lines arranged in sequential order depending on a sequential change of a row address, a row decoder that, for each row address input to the row decoder, scrambles a first bit of the row address and a second bit of the row address depending on a selection signal, thereby forming a scrambled row address, decodes the scrambled row address, and selects a word line from the word lines based on the scrambled row address, and an anti-fuse array that includes an anti-fuse in which a logical value of the selection signal is programmed. A first word line and a second word line of the word lines may be adjacent to each other, and a difference between a first value of the row address corresponding to the first word line and a second value of the row address corresponding to the second word line may be a value corresponding to the first bit.

Memory device scrambling address

A memory system includes a memory device having a plurality of volatile memory modules therein, and a memory controller, which is electrically coupled to the plurality of volatile memory modules. The memory controller is configured to correct an error in a first of the plurality of volatile memory modules in response to generation of an alert signal by the first of the plurality of volatile memory modules, concurrently with an operation to refresh at least a portion of a second of the plurality of volatile memory modules upon the generation of the alert signal.

Memory module including a volatile memory device, memory system including the memory module and methods of operating a multi-module memory device

A storage module includes a dynamic random access memory (DRAM) device, a nonvolatile memory device, and a high-speed buffer memory. An method of operating the storage module includes copying target data stored in the nonvolatile memory device to the high-speed buffer memory in response to an external device entering a page fault mode, receiving a first refresh command from the external device, and, in response to the first refresh command, performing a first refresh operation associated with the DRAM device and moving the target data copied to the high-speed buffer memory to the DRAM device during a first refresh reference time.

Storage modules, methods of operating a storage module, and methods of operating a host controlling a storage module

A memory module includes a first type memory, a second type memory, a serial presence detect device and a controller. The serial presence detect device is configured to transfer capacity information of the second type memory to an external host device, during an initialization operation. The controller is configured to transfer a training command for the second type memory received from the external host device to the first type memory, during a training operation, which follows in time the initialization operation.

Memory module and memory system including memory module

A data backup method for performing a post package repair (PPR) operation includes reading repair unit information of a memory device, storing the repair unit information in a register, determining whether to perform the PPR operation in response to a read error occurring while the memory device is being accessed, and performing a data backup operation of the memory device based on the repair unit information in response to determining that the PPR operation is to be performed.

Data backup method for performing post package repair (repair on system) operation

A semiconductor memory device includes a memory cell array, sub word-line drivers and power selection switches. The memory cell array includes memory cell rows coupled to word lines. The sub word line drivers are coupled to the word lines. The power selection switches are coupled to the sub word-line drivers. Each power selection switch controls a deactivation voltage level of a first word-line activated from the word-lines and an off-voltage level of a second word line adjacent to the first word line so that the deactivation voltage level and the off-voltage level have at least one of a ground voltage, a first negative voltage and a second negative voltage. The ground voltage, the first negative voltage and the second negative voltage have different voltage levels from each other.

Semiconductor memory devices and memory systems including the same

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Seoul, South Korea

Dae-Jeong Kim