Skhynix Inc.

Da In Im

Young Suk Seo

Seung Wook Oh

Jong Ho Jung

Seung Hun Lee

Woongrae Kim

Kyung Mook Kim

An electronic device includes a shifting circuit and a dock repeater. The shifting circuit is configured to generate a write shifting flag that is inactivated when a write signal for a write operation is activated. The clock repeater is configured to block generation of a read repeating dock that is used in a read operation when the write shifting flag is inactivated.

Electronic devices for controlling clock generation

A skew compensation circuit includes a skew detection circuit configured to generate skew detection signals by detecting a skew characteristic of a basic logic element constituting a semiconductor apparatus, a skew compensation signal generation circuit configured to generate a skew compensation signal by comparing the skew detection signals and a plurality of reference voltages, a variable delay circuit configured to generate a compensation signal by delaying an input signal by a delay time varied according to the skew compensation signal, and a reference voltage generation circuit configured to generate the plurality of reference voltages of which offset components are compensated for according to variations of a temperature and an external voltage.

Skew compensation circuit and semiconductor apparatus including the same

A phase detection circuit is configured to receive an input clock signal and a reference clock signal. The phase detection circuit is configured to generate a divided clock signal from the reference clock signal. The phase detection circuit is configured to generate a phase detection signal after comparing the phase of the input clock signal with the divided clock signal.

Phase detection circuit, and clock generation circuit and semiconductor apparatus including the phase detection circuit

A phase detection circuit includes an edge trigger circuit and a duty detection circuit. The edge trigger circuit generates a reference pulse signal and a comparison pulse signal based on a target clock signal and at least two clock signals having phases adjacent to the phase of the target clock signal. The duty detection circuit generates a phase detection signal by detecting the duty ratio of the reference pulse signal and the comparison pulse signal.

Phase detection circuit, and clock generating circuit and semiconductor apparatus using the phase detection circuit

A semiconductor apparatus includes a clock path, a command path, a delay monitoring circuit, and an output control circuit. The clock path generates a delay clock signal by delaying a clock signal. The command path generates an output command signal from on one of a command signal and the clock signal, based on a monitoring signal. The delay monitoring circuit generates a delay control signal and a latency control signal based on a phase difference between the delay clock signal and the output command signal, when the monitoring signal is enabled. The output control circuit generates an output enable signal by synchronizing the output command signal with the delay clock signal, based on the latency control signal.

Semiconductor apparatus capable of synchronizing command signal and clock signal, and operation method thereof

A delay control device and method are disclosed, which relate to a technology for compensating for a delay difference of a delay locked loop (DLL). The delay control device may include a delay locked loop (DLL) configured to adjust a delay time of a delay line, and compensate for a delay time of a replica delay circuit based on a calibration signal. The delay control device may include a real clock path delay circuit configured to delay an output of the delay locked loop (DLL. The delay control device may include a control signal generator configured to generate the calibration signal in consideration of a difference between the delay time of the replica delay circuit and the delay time of the real clock path delay circuit.

Delay control device and method for the same

A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a correction code generator configured to generate a reference correction code according to a duty detection signal based on a phase difference between the pair of first reference clocks, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

Clock generation circuit and semiconductor apparatus and electronic system using the same

A duty cycle detector may include a rising clock detection unit enabled in response to a first control signal; a falling clock detection unit enabled in response to a second control signal with a different activation timing from the first control signal; and a comparison unit configured to compare an output signal of the rising clock detection unit to an output signal of the falling clock detection unit in response to a comparison enable signal, and output a duty cycle detection signal.

Duty cycle detector

A duty cycle detection circuit may include: a timing signal generation unit to generate a plurality of timing signal groups by selectively combining multi-phase clock signals according to an enable signal; and a detection unit to generate a duty detection signal by selectively combining signals of the plurality of timing signal groups according to the enable signal.

Duty cycle detection circuit and method

Duty cycle detector and semiconductor integrated circuit apparatus including the same

A clock generation circuit may include a reference clock generator configured to generate a pair of first reference clocks in an offset code generation mode, a triggering unit configured to generate a pair of second reference clocks from the pair of first reference clocks, a pulse detector configured to generate a duty detection signal based on a phase difference between the pair of second reference clocks, a correction code generator configured to generate a reference correction code based on the duty detection signal, and an offset code generator configured to generate an offset code based on the reference correction code and a preset reference code.

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Icheon-si, South Korea

Da In Im