Huazhong University of Science and Technology

Da He

Xiangshui Miao

Hao Tong

A pretreatment method of a selector device is provided, which includes: (1) performing a first voltage scan of a selector through selecting a voltage scan range and setting a first limit current Ito obtain a resistance state Rof a sub-threshold region thereof; (2) setting an nlimit current Iand performing an nvoltage scan of the selector according to a resistance state Rof a sub-threshold region of the selector after an n&#x2212;1voltage scan to obtain a resistance state Rof a sub-threshold region thereof, where, I&#x3c;I, and an initial value of n is 2; and (3) stopping a voltage scan of the selector device under a read voltage is applied when a resistance value of a high resistance state of the selector device after the nvoltage scan is greater than a resistance value of a high resistance state of the selector device after the first voltage scan; otherwise, n=n+1, and returning to Step (2).

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Hubei, China

Da He