Ircon, Inc.

Containerless Research, Inc.

D Scott Hampton

Shankar Krishnan

Sam Paris

Eugene F Kalley

James Rix

David W Jenkins

In a device for measuring the complete polarization state of light over a spectral bandwidth, an optical input signal () with wavelengths of light within a spectral band is incident on two or more diffraction gratings (), or incident from at least two directions on one or more diffraction gratings (), and the intensity is measured as a function of wavelength for at least four of the diffraction spectra produced by the grating(s). The polarization state of light is then calculated as a function of wavelength over the spectral bandwidth from the intensity measurements.

Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings

A contamination detection apparatus is provided for measuring an amount of contamination on an optically transmitting element or pane. The optically transmitting element is capable of transmitting electromagnetic radiation. The contamination detection apparatus includes a contamination detection (CD) radiation source for providing a source intensity of radiation. The source intensity or radiation passes through the optically transmitting element at least one time. A reference detector is also provided for detecting the source intensity of radiation, and the reference detector has a reference output level that is representative of the source intensity.

Window contamination detector

Growing community of inventors

Mundelein, IL, United States of America

D Scott Hampton