Amazon Technologies, Inc.

Cyrille Habis

Rakesh Kulangara

Martin Helliwell

Rafael Camargo

Biju Balakrishna Pillai

Yuzhi Zhang

Melissa Sue Erickson

Tianwei Liu

David Junwei Tse

Tianhe Wang

Maulik Jayesh Pandey

Device health metrics may be collected and aggregated on a device before sending to a server for further aggregation. The method may include determining a crash has occurred on a device, and recording the crash and information corresponding to the crash in buffer storage on the device. The method may also include recording a crash type, a crash time, an identification of a component that caused the crash and a state of the device when the crash occurred. The method may also include grouping two or more crash events based on the crash type, generating device health metrics data including metadata corresponding to the two or more crash events, storing the device health metrics data in the buffer storage on the device, and sending the device health metrics data along with device identification information to a server for further aggregation.

Collection and aggregation of device health metrics

A leak detection system may be configured to receive a plurality of memory use reports periodically from a user device. The memory use reports may include an indication of memory that may be used and/or allocated by/to a particular process, such as a process that may currently be running on the user device. The memory use report may further provide a relatively granular view of the allocation of memory associated with the process, such as by type of memory and/or category of memory associated with the process. The leak detection system may use the plurality of memory use reports to generate a memory profile associated with the process and particular memory types and/or categories of memory allocation. By analyzing the memory profiles, the leak detection system may be configured to identify a memory leak associated with the process on the user device.

Process level memory allocation by memory type

Memory leak detection

Growing community of inventors

Mountain View, CA, United States of America

Cyrille Habis