Texas Instruments Corporation

Curtis E Miller

Glenn E Schuette

James E Rousey

Edward J Russell

Xinqun Zeng

The distribution of Bluetooth IDs among multiple integrated circuit testers at multiple sites for programming with a master database containing large size ID blocks, site operational databases with medium size ID blocks and tester programs with small size ID blocks provides reduced memory requirements and limits the chance of two units with a duplicate ID.

Key distribution

According to one embodiment of the invention, a method for resuming the probing of a wafer includes identifying a data set associated with a wafer. The data set identifies at least one unprobed die supported on the surface of the wafer. The method also includes determining that the data set associated with the wafer is useable and generating a probe map of the wafer from the data set. The probe map identifies a physical position associated with each unprobed die supported on the surface of the wafer. The probe map and one or more probe commands are communicated to a probe module to drive the probe module in resuming the probe of the wafer.

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Wylie, TX, United States of America

Curtis E Miller