Western Digital Technologies, Inc.

Curtis Adam Harper

David Robison Hall

Paul Edward Movall

Scott E Burton

Lynn Charles Berning

Eric L Severtson

Daniel R Ostrander

Robert Joseph Harvey

Aleksandr Dean Schwerdt

David Alexander Jachmann

An apparatus for electrically coupling an electrical interface of a unit under test with a debugging component includes a bracket assembly having a socket configured to electrically couple with the electrical interface, a baseplate assembly configured to secure the unit under test on a plate, a crane assembly coupled to the bracket assembly, and a cable assembly. The crane assembly is configured to enable movement of the socket relative to the electrical interface in each of a horizontal direction, a vertical direction, and an angular direction; and secure the socket in place relative to the electrical interface while applying a force by the socket against the electrical interface. The cable assembly is associated in part with the bracket assembly and is configured to electrically couple with the socket at a first end and with the debugging component at a second end.

Apparatus and method for electrically coupling a unit under test with a debugging component

A data storage device is disclosed comprising a head actuated over a disk. The disk is spun at a first speed while writing first data to the disk based on a first disk format defining a first capacity for the disk. When a command is received from a host to spin the disk at a second speed different from the first speed, the disk is spun at the second speed while writing second data to the disk based on a second disk format defining a second capacity for the disk different from the first capacity.

Data storage device operated at different spin speeds

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Berthoud, CO, United States of America

Curtis Adam Harper