Boe Technology Group Co., Ltd.

Fuzhou Boe Optoelectronics Technology Co., Ltd.

Fuzhou Boe Optoelectronics Co., Ltd.

Cundui Tang

Yang Yu

Yong Wang

Hongyan Guo

Huailiang Wu

Zongtian Xie

Zengyang Jiang

Jaeyoung Joo

Yo Seop Cheong

Lingling Fan

Panpan Cai

Yoseop Cheong

Huazhong Yao

Cheong Yo Seop

A workbench for mounting an electrical function test unit includes: a mounting surface for mounting the electrical function test unit, wherein the mounting surface is provided with a connecting area, and a number of mounting through holes are arranged in the connecting area; and connectors detachably connected with the mounting through holes and configured to match with mounting screws of the electrical function test unit when the electrical function test unit is mounted on the workbench. The workbench has long service life, reduces the replacement difficulty of the electrical function test unit and shortens the downtime, thereby improving the detection efficiency of the display screen.

Workbench for mounting electrical function test unit

The present disclosure provides a lighting-on device and a method for cell test. The lighting-on device includes a movable unit including a first marker; an image acquisition unit configured to acquire an image indicating an actual relative positional relationship between the first marker and a second marker on a display panel; a calculation unit configured to calculate the actual relative positional relationship between the first marker and the second marker according to the image; a first position adjustment unit configured to drive the movable unit so as to adjust the actual relative positional relationship; and a first control unit configured to determine whether the adjusted actual relative positional relationship has been aligned by the first position adjustment unit according to the relative positional relationship between the first marker and the second marker.

Lighting-on device and method for cell test

The present disclosure provides a shorting bar structure and a method for manufacturing the same, and a Thin Film Transistor (TFT) substrate. The shorting bar structure comprises: a test wire; a test probe contact part connected to the test wire and configured to be able to contact with a test probe; and at least one PN junction structure located between the test wire and at least one wire under test, and configured to allow a test signal to be unidirectionally transmittable in a direction from the test wire to the wire under test.

Shorting bar structure and method for manufacturing the same and thin film transistor substrate

Growing community of inventors

Beijing, China

Cundui Tang