Zhejiang University

Zhejiang Lab

Zhejiang Normal University

Cuifang Kuang

Xu Liu

Shaocong Liu

Shuai Li

Daru Chen

Wanjie Dong

Yuxuan Qiu

Chuankang Li

Yuran Huang

Jisen Wen

Hongqing Wang

Zhimin Zhang

Mengbo Tang

Xiaoyi Zhang

Yusen Zhang

Yuxian Lu

Zhaotai Gu

Zhenyao Yang

Xiang Hao

Ziang Wang

Lanxin Zhan

A confocal scanning dark field microscopy imaging method and device, comprising: modulating a phase of a laser beam emitted by a laser into a 0-2π π vortex phase, where n>3; conjugating the modulated laser beam with an entrance pupil of an objective lens of a confocal scanning microscope, so that a focusing spot of the objective lens is a hollow spot, and an inner ring radius of the hollow spot is greater than a radius of a solid spot without phase modulation; and enabling the confocal scanning microscope to work, thereby achieving dark field microscopy imaging. The present disclosure adopts a confocal design with a pore placed in front of the detector. The plane of the pore is conjugated with the object plane, blocking a defocusing signal from entering the detector.

Confocal scanning dark field microscopy imaging method and device

The present disclosure relates to a method and device for removing background noise in microscopic imaging based on frequency-domain modulation. The method includes irradiating a surface of a sample to be measured by simultaneously irradiating the surface of the sample by utilizing two beams from two laser devices. One of the two beams passes through a 0˜2π vortex phase plate and then focuses on the sample to be measured to form a high-energy hollow spot, and the other of the two beams focuses on the sample to be measured to form a low-energy solid spot. The method further includes modulating the two beams in time-domain simultaneously using an electro-optic modulator and demodulating signal light at different frequencies using a lock-in amplifier, then removing the background noise by a differential process to realize a high signal-to-noise ratio super-resolution image.

Method and device for removing background noise in microscopic imaging based on frequency-domain modulation

A super-resolution microscopic imaging method and apparatus based on common-path parallel fluorescence emission difference microscopy. In the method, a liquid crystal spatial light modulator is used to modulate excitation light in fluorescence emission difference microscopy super-resolution microscopic imaging, and two parts of the spatial light modulator are respectively loaded into 0-2π vortex phase modulation and blazed grating, so that the common-path excitation light forms solid spot and doughnut-shaped spot with a certain distance on a sample surface at the same time, and parallel scanning is carried out, thereby ensuring that the imaging speed is doubled compared with that of ordinary fluorescence emission difference super-resolution microscopic imaging, and at the same time, the two excitation lights are not easily affected by noise, drift and other interferences due to the common path.

Super-resolution microscopic imaging method and apparatus based on common-path parallel fluorescence emission difference microscopy

Disclosed is a phase-modulated fluorescence differential microscopic imaging device based on electro-optical modulation technology, including an illumination system for generating an excitation beam, a detection system for collecting a fluorescent signal emitted by a sample, and a computer for controlling and signal processing. The illumination system includes the following components that are sequentially arranged: a laser, emitting a laser beam; an electro-optical modulation module, configured to control a rapid conversion of the laser beam between a right-handed circularly polarized light and a left-handed circularly polarized light; and a phase modulation device, configured to modulate a circularly polarized light to form a solid light spot and a hollow light spot for illuminating the sample and exciting fluorescence. Also disclosed is a phase-modulated fluorescence differential microscopic imaging method based on the electro-optical modulation technology, which realizes a rapid conversion of a solid light spot and a hollow light spot, and improves the imaging speed of the fluorescence differential microscopic imaging system to a large extent.

Phase-modulated fluorescence differential microscopic imaging method and device based on electro-optical technology

A method and an apparatus for direct writing photoetching by parallel interpenetrating super-resolution high-speed laser. The method of the present application uses a parallel interpenetrating algorithm. Firstly, a multi-beam solid light spot for writing is generated based on a writing light spatial light modulator; a multi-beam hollow light spot for inhibition is generated based on an inhibition optical spatial light modulator; the multi-beam solid light spot is combined with the multi-beam hollow light spot to generate a modulated multi-beam light spot; a writing waveform is output based on a multichannel acousto-optic modulator, a displacement stage moves at a constant speed until writing of a whole column of areas is completed, an optical switch is turned off, and the displacement stage conducts one-time stepping movement; the process is not stopped until all patterns are written.

Method and apparatus for direct writing photoetching by parallel interpenetrating super-resolution high-speed laser

This invention discloses a super-resolution microscopy method and device, of which the method comprises the following steps: converting laser beam into linearly polarized light after collimation; linearly polarized light is deflected and phase modulated by a spatial light modulator; the deflected beam is focused, collimated and then converted into circularly polarized light for projection on the sample to collect signal light from various scanning points on the sample, and obtaining the first signal light intensity; switching over modulation function to project linearly polarized light modulated by the second phase modulation on the sample to collect signal light from various scanning points on the sample, and obtaining the second signal light intensity; calculating valid signal light intensity to obtain the super-resolution image. This device features in a simple structure and easy operation, which can obtain a super-resolution beyond diffraction limit at a lower luminous power; it is quick in image formation with the frame frequency over 15 frames when the number of scanning points in each image is 512&#xd7;512.

Super-resolution microscopy method and device

Growing community of inventors

Hangzhou, China

Cuifang Kuang