Intel Corporation

Craig Yost

Paul J Diglio

Christopher Wade Ackerman

Joseph B Petrini

Kelly Lofgreen

Jensen Stenberg

Ruben Nunez Blanco

Varun Narayan

Sami Alelyani

This disclosure describes systems, methods, and devices related to preventing water leakage from jet impingement applied to an integrated circuit under test. An integrated circuit testing apparatus for applying jet impingement to an integrated circuit may include an impingement chamber in contact with an integrated circuit being tested, the impingement chamber comprising water associated with cooling the integrated circuit; and an actuator-driven thermal management block including an air inlet configured to direct a flow of air into an immediate test environment for the integrated circuit to generate a positive pressure differential with respect to the water in the impingement chamber to prevent leakage of the water from the impingement chamber.

Enhanced jet impingement leak prevention for integrated circuit

The present disclosure is directed to a system having a first loading component and a second loading component for applying load to a device during a test of the device, the first loading component is configured to be moveable with respect to the second loading component. The system includes a seal member arranged between the first loading component and the second loading component, the seal member is adapted to engage the device during testing so as to apply a load against the device during testing and provide sealing around a cavity positioned below the first loading component and above the device.

System and apparatus having a seal member for sealing of a device under test

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Gilbert, AZ, United States of America

Craig Yost