Cascade Microtech, Inc.

Craig Stewart

Anthony James Lord

Rod Jones

Jeff Spencer

John L Dunklee

Tim Lesher

Peter McCann

Brad Froemke

Terry Burcham

Peter Navratil

Scott Runbaugh

Gavin Fisher

Pete McCann

David Newton

A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Chuck for holding a device under test

A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.

Probe station with two platens

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Probe station

Growing community of inventors

Bloxham, United Kingdom

Craig Stewart