Harrick Scientific Corporation

Craig R Wisch

Nicolas J Harrick

Milan Milosevic

An optical accessory for reflection spectroscopy having a very small sampling area and provided with a microscope for aiding the user to locate a sample to be analyzed on the active sampling area where it can interact with a radiation beam. The microscope is characterized by fiber optic bundles to supply sample illumination via a cone-shaped light-funnelling tip terminated in a thin hard optically transparent wear tip, e.g., of sapphire. The microscope is also used to apply pressure via the wear tip to the sample while it is being illuminated and while it can be viewed to maximize interaction with the radiation.

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Croton on Hudson, NY, United States of America

Craig R Wisch