Photothermal Spectroscopy Corp.

Bruker Nano Gmbh

Anasys Instruments Corporation

Veeco Instruments Inc.

University of Illinois

Other

The Dow Chemical Company

Bruke Nano Inc.

Craig Prater

Kevin Kjoller

Derek Decker

Chanmin Su

Roshan Shetty

David A Grigg

Nghi Phan

Honghua Yang

Jian Shi

Doug Gotthard

Sam Berweger

William P King

Ji Ma

Michael Reading

Craig Cusworth

Konstantin L Vodopyanov

Markus B Raschke

Byeonghee Lee

Anthony Kurtz

Clotilde Policar

A Dazzi Dazzi

Virgil B Elings

Paul K Hansma

James Massie

Mikhail A Belkin

Barney Drake

Johannes H Kindt

Robert C Daniels

Steven Nagle

Johannes Kindt

Jeffrey M Markakis

Wenjun Fan

Gregory F Meyers

Bryant R LaFreniere

Eoghan Dillon

Andrew Stuart

Feng Lu

Mustafa Kansiz

Qichi Hu

Khoren Sahagian

Michael Lo

Jonathan R Felts

Vladislav V Yakolev

Jeffrey Markakis

Methods and systems described herein detect autofluorescence of a sample. These methods and systems obviate the need for addition of fluorophores to samples to create IR absorption.

Autofluorescence enhanced photothermal infrared spectroscopy

Detection of microplastics is accomplished using a combination of techniques. A position-detection technique such as crossed-polarization detection, autofluorescence detection, or photothermal infrared imaging is used to determine the locations of microplastics in a sample. Infrared absorption can be detected at those locations to characterize the microplastics. In this way the microplastic content can be located and characterized more quickly and accurately than using conventional techniques.

Automated spectroscopic analysis of micron-scale microplastic particles with optical photothermal infrared spectroscopy

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects.

Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy

Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

Wide area optical photothermal infrared spectroscopy

Improvements in spectroscopy are disclosed herein that rely on the interaction of both an infrared beam and a probe beam with a sample. These beams are used in a pump-probe arrangement, with a fiber optic probe collecting the beams of infrared and probe radiation from the infrared source and delivering it to the sample. At least a portion of the beam of infrared radiation and the beam of probe radiation overlap one another on the sample. The fiber also collects probe radiation that has interacted with the sample. A detector can use this collected signal to indicate an intensity of the collected probe radiation, and an analyzer can generate a signal indicative of infrared absorption of the sample adjacent the fiber.

Method and apparatus for fiber optic photothermal imaging and spectroscopy

A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.

Method and apparatus for high performance wide field photothermal imaging and spectroscopy

Methods described herein provide improvements on composite infrared absorption imaging. Scanning patterns described herein reduce erroneous measurements caused by thermal drift, as well as optical interference that occurs between light scattering from the top surface of the sample and light scattering from an underlying substrate.

Method and apparatus for improved composite multi-wavelength photothermal infrared imaging

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

Asymmetric interferometric optical photothermal infrared spectroscopy

System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.

Method and apparatus for enhanced photo-thermal imaging and spectroscopy

Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

Photothermal infrared spectroscopy utilizing spatial light manipulation

Autofluorescence photothermal characterization systems and methods

Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.

Fluorescence enhanced photothermal infrared spectroscopy and confocal fluorescence imaging

Interferometric optical photothermal infrared spectroscopy

Growing community of inventors

Santa Barbara, CA, United States of America

Craig Prater