Texas Instruments Corporation

Craig James Lambert

Dale A Heaton

Vanessa Marie Bodrero

Alain Charles Chiari

Lianrui Zhang

The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.

Method and apparatus for synchronizing signals in a testing system

According to one embodiment of the invention, a system for testing electronic devices includes a first RF source operable to output a first signal, a second RF source operable to output a second signal, a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal, one or more down converters operable to receive respective output signals from respective electronic devices and create respective down converted signals, and a set of switches operable to switch the second RF source to a local oscillator function that couples to the one or more down converters for inputting respective reference signals into the one or more down converters.

Method and system for multisite RF transceiver testing

The compare path bandwidth control for high performance automatic test systems provides a standard dual comparator mode with single ended transmission lines for low frequency applications with a capability of receiving a differential signal when using the dual comparators ( ), ( ) as an effective single comparator for high frequency applications.

Growing community of inventors

Plano, TX, United States of America

Craig James Lambert