Xilinx, Inc.

Craig E Taylor

Matthew H Klein

Wei Yee Jocelyn Teo

Embodiments described herein include techniques for providing information regarding a hardware part using a scannable code so that a customer can make an informed decision when placing the hardware part in a larger computing system. A customer may purchase hardware parts that are categorized into a certain bin which has guaranteed range of power consumption or performance. The customer may over design the computing system to accommodate the worst parameter in the range (e.g., the minimum performance or the maximum power consumption) to ensure the timing or power specifications are not violated. Instead, the embodiments herein provide a scannable code on the hardware part which the customer can use to access a database which stores more granular information about the part. The customer can use the performance parameters to make better informed decisions to determine where to place the part in the computing system.

Database lookup using a scannable code for part selection

Techniques for improved semiconductor inventory tracking, control, and testing are provided. The techniques include marking the semiconductor packaging with a 2-dimensional ('2D') bar code that is stored in a data server. The data server associates the 2D barcode with performance data for the semiconductor, as well as with a 'circuit-based identifier,' which comprises hard-wired electrical features that uniquely identify the semiconductor and that are embedded within the semiconductor. Associating the 2D bar code with chip performance reduces the number of times that a chip needs to be tested. Associating the 2D bar code with the circuit-based identifier provides certain functionality such as anti-counterfeiting functionality, device verification, and the like.

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San Jose, CA, United States of America

Craig E Taylor