General Electric Company

Craig Alan Cantello

Kevin George Harding

Shu-Guo Tang

Hua Wang

Anthony Sebastian Bauco

Sandra F Feldman

John W Devitt

Robert William Tait

James P Barren

Kena Kimi Yokoyama

Harsha Mysore Hatti

Arthur Joseph Osborn

James Louis Cifarelli

Andrew Joseph Poslinski

Grigoriy Aleksandrovich Shmigol

John William Devitt

A projector () projects a structured light pattern () along a first optical axis () onto a surface (). A viewer () attached to the projector () receives a reflection of the structured light pattern () from the surface () along a second optical axis (), and digitizes a two-dimensional snapshot. The optical axes () are non-parallel, and they meet within a common field of view of the projector () and the viewer (). A computer () interfaced to the viewer () receives the digitized snapshot, and analyzes it to mathematically model the surface for display and inspection. The projector and attached viewer are designed as a hand-held unit with a hand grip () and a trigger button () to trigger a snapshot. A guide tip () on the unit extends beside the two optical axes () to the common field of view to position the hand-held unit.

Optical edge break gage

A phase shifting imaging module in a handheld imager is provided. The phase shifting imaging module includes a first beam splitter configured to split an image radiation beam into first and second image radiation beams. It also includes a first prism configured to align the first and second image radiation beams, and a second beam splitter configured to split the first and second image radiation beams into four image radiation beams. A second prism aligns the four image radiation beams. A phase mask introduces phase retardation between the four image radiation beams, resulting in four phase shifted image radiation beams. A pixilated sensor generates image data based upon each of the four phase shifted image radiation beams.

Phase shifting imaging module and method of imaging

A method facilitates inspection of a component surface. The method comprises positioning a surface of the component to be inspected in an optical path of at least one infrared radiation detector, heating the component surface using electromagnetic radiation to cause an increase in radiance from a defect present at the component surface, and detecting temperature variations within the component surface using the at least one infrared radiation detector, such that the surface irradiance is measured at predetermined locations across the component surface. The method further comprises detecting cracks in the component by analyzing radiation transient response data received by the infrared radiation detector, and correlating the temperature variations to the radiation transient response data to determine a depth of the detected cracks.

Methods for determining the depth of defects

A spatially-resolved spectrometer is used to measure streaking in molded sample plastic parts produced using a molding tool with various mold inserts which produce certain desired topological surface features upon these sample plastic parts. The measurements from one or more of these sample plastic parts are then provided to a computerized device which appropriately filters the data and calculates overall data shape, average peak and valley shift, and a quality number indicative of data slopes. These calculations are then used to determine an optimum set of ingredients and processing conditions to be used for the full-scale plastic part production.

System and method to quantify appearance defects in molded plastic parts

Growing community of inventors

Schenectady, NY, United States of America

Craig Alan Cantello