Corning Incorporated

Correy Robert Ustanik

Philip Robert LeBlanc

En Hong

Peter Knowles

Rajeshkannan Palanisamy

Uta-Barbara Goers

Chong Pyung An

Gabriel Pierce Agnello

Sung-chan Hwang

Ji Hwa Jung

Tae-ho Keem

Sung-jong Pyo

Jacques Gollier

Vitor Marino Schneider

Daniel Ralph Harvey

John Steele Abbott, Iii

Michal Mlejnek

Johannes Moll

Siva Venkatachalam

David Matthew Berg

Douglas S Goodman

William Kenneth Denson

Jiaxiang Zhang

Hyeong-cheol Lee

Jeffrey Allen Knowles

Amanda Kathryn Thomas

David Bruce Moorehouse

Denwood Falconer Ross, Iii

Methods for detecting defects on the surface of a sheet of material include collimating a beam of light and intersecting the collimated beam of light with a beam splitter. The beam splitter directs a first portion of the intersected beam of collimated light to illuminate a first surface of the sheet, wherein a first portion of the light illuminating the first surface is reflected and a second portion of the illuminating light is scattered by a defect. The reflected and scattered light is received with a first lens element that directs the reflected and scattered light to an inverse aperture. The reflected light is blocked by the inverse aperture and the scattered light is transmitted by the inverse aperture. The scattered light transmitted by the inverse aperture is directed with a second lens element to an imaging device.

Methods and apparatus for detecting surface defects on glass sheets

Disclosed herein are apparatuses and methods for measuring electrostatic charge on a surface of a substrate. The apparatuses comprise a substrate mounting platform, a substrate contacting component, and at least one voltage sensor, wherein the apparatus is programmed to independently control the rotational and translation velocity of a roller and/or to measure a voltage of the substrate at multiple points to produce a two-dimensional map of voltage for at least a portion of the substrate.

Method and apparatus for measuring electrostatic charge of a substrate

A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Method and apparatus for inspecting defects on transparent substrate and method emitting incident light

A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Method and apparatus for inspecting defects on transparent substrate

Apparatus and method for testing a sheet of brittle material comprising the steps of measuring one or more edge features of a sheet of brittle material, imparting a bend to the sheet of brittle material and producing relative motion between the sheet and the bend such that the bend traverses the sheet. A stress can be induced in the sheet as a function of the relative motion and imparted bend, wherein the induced stress corresponds to a predetermined strength value, and the measured one or more edge features can be correlated with the strength value.

Edge strength testing methods and apparatuses

A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Apparatus and methods for determining surface compliance for a glass surface

Methods and apparatus () for estimating the gravity-free shape of a flexible object () such as a thin sheet of glass are provided. In certain embodiments, an estimate of the gravity-free shape is produced using a bed-of-nails (BON) gauge () and then the shape is measured at a higher spatial resolution using a second gauge (), with the theoretical sag between the pins () of the BON gauge being subtracted from the shape measured by the second gauge. In other embodiments, shape measurements are performed on both sides of the object () and used to estimate the reliability of the gravity-free shape estimate. In further embodiments, the bed-of-nails gauge () uses a least squares minimization procedure in adjusting the heights of the pins ().

Methods and apparatus for estimating gravity-free shapes

A thickness of at least one preselected portion of a substrate, such as glass substrate for example, is controlled. A laser beam is directed to the at least one preselected portion of the substrate in a viscous state, thereby increasing a temperature and reducing a viscosity of the at least one preselected portion of the substrate in a viscous state sufficiently to cause the at least one preselected portion of the glass substrate to attain a desired thickness. The laser beam after it is generated can be directed to a reflecting surface from which the laser beam is reflected to the at least one preselected portion of the substrate in the viscous state. The substrate can comprise a glass ribbon produced in a downdraw glass forming process for example, and the laser beam can be directed onto a plurality of preselected portions of the glass ribbon.

Thickness control of substrates

A distortion measurement and inspection system is presented. In one embodiment, a vision system is implemented. The vision system performs dual focal plane imaging where simultaneous imaging of two focal planes is simultaneously performed on a sample substrate and a reference substrate to determine distortion. In addition, a highly reflective background is implemented to provide for more resolution during distortion measurement.

Distortion measurement imaging system

A method of calibrating a measurement an inspection system used in the LCD industry is presented. An assembly is created including two substrates coupled by a transducer. Two fixtures also adhere to the substrates and are connected to an interferometer. An inscription is created by marking at least one of the substrates using a reference point on a support table of the measurement and inspection system as a reference. The transducer is then operated to simulate an LCD glass process such as a thermal process or a glass cutting process. Operating the transducer also generates signals that are measured by the interferometer and represent a first distortion measurement. The inscription is then compared to reference mark to determine a second distortion measurement. A comparison of the first distortion measurement and the second distortion measurement are then used to calibrate the measurement and inspection device.

Method and apparatus for distortion measurement imaging

An apparatus and method for detecting defects in a transparent substrate by simultaneously using a combination of bright field and dark field light sources for illuminating the substrate. The apparatus is capable of detecting both inclusions and surface defects simultaneously while the substrate is in motion, simplifying the characterization of substrates in a manufacturing setting.

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Painted Post, NY, United States of America

Correy Robert Ustanik