Leica Microsystems Cms Gmbh

Cornell Gonschior

Christian Schumann

Tobias Bauer

Albrecht Weiss

Christian Schulz

An optical scanning microscope includes an illumination system having a light source portion emanating from a light source, first and second polarizing beam splitters, and first and second optical channels disposed between the beam splitters. The light source portion is configured to emit a first illumination light beam comprising light of a first main polarization direction and of a second main polarization direction. The first beam splitter is configured to guide the light primarily into the first and channels, respectively. The second beam splitter is configured to form a second illumination light beam from light of the first and second main polarization directions from the first channel and second channels, respectively. The first and second channels are configured to emit the light of the first and second main polarization directions from the first and second channels, respectively, so as to have different types of convergence.

Optical scanning microscope and examination method

A microscope includes at least one correction unit arranged in a beam path for correcting a variable spherical aberration. The correction unit has at least one optical correction element that is arranged in a convergent or divergent area of the beam path such that the optical correction element is movable along an optical axis. The at least one optical correction element has at least one correction surface. A part of the at least one correction surface through which the convergent or divergent area of the beam path passes forms a correction-effective surface section whose radial extension crosswise to the optical axis is adjustable by moving the correction element along the optical axis.

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Friedberg, Germany

Cornell Gonschior