International Business Machines Corporation

Johnson and Johnson Vision Care, Inc.

Cornelia Tsang Yang

John Ulrich Knickerbocker

Bing Dang

Paul Stephen Andry

Li-Wen Hung

Jeffrey Donald Gelorme

Joshua T Smith

Benjamin H Wunsch

Steven Lorenz Wright

Adam Toner

Daniel B Otts

Bucknell Chapman Webb

James Daniel Riall

Eric Peter Lewandowski

Eugene John O'Sullivan

Eric Andrew Joseph

Leathen Shi

Sebastian Ulrich Engelmann

Jeff Waksman

An apparatus for sorting macromolecules includes a first chip including a channel formed in a first side of the first chip and having at least one monolithic sorting structure for sorting macromolecules from the sample fluid. A first set of vias formed in the first chip has openings in a second side of the first chip, the sample fluid being provided to the sorting structure through the first set of vias. A second set of vias formed in the first chip has openings in the second side for receiving macromolecules in the sample fluid greater than or equal to a prescribed dimension sorted by the sorting structure. A third set of vias formed in the first chip has openings in the second side for receiving macromolecules in the sample fluid less than the prescribed dimension. The apparatus includes first and second seals covering the first and second sides, respectively.

Layered silicon and stacking of microfluidic chips

In one example, a battery includes a negative terminal, a positive terminal, an electrolyte contained between the negative terminal and the positive terminal, and a hydrogel layer positioned between and physically separating the negative terminal and the positive terminal.

Microbattery separator

Various embodiments process semiconductor devices. In one embodiment, a release layer is applied to a handler. The at least one singulated semiconductor device is bonded to the handler. The at least one singulated semiconductor device is packaged while it is bonded to the handler. The release layer is ablated by irradiating the release layer through the handler with a laser. The at least one singulated semiconductor device is removed from the transparent handler after the release layer has been ablated.

Handler bonding and debonding for semiconductor dies

A multi-layer wafer and method of manufacturing such wafer are provided. The method comprises applying a stress compensating oxide layer to each of two heterogeneous wafers, applying at least one bonding oxide layer to at least one of the two heterogeneous wafers, chemical-mechanical polishing the at least one bonding oxide layer, and low temperature bonding the two heterogeneous wafers to form a multi-layer wafer pair. The multi-layer wafer comprises two heterogeneous wafers, each of the heterogeneous wafers having a stress compensating oxide layer and at least one bonding oxide layer applied to at least one of the two heterogeneous wafers. The two heterogeneous wafers are low temperature bonded together to form the multi-layer wafer.

Wafer level integration including design/co-design, structure process, equipment stress management, and thermal management

Various embodiments process semiconductor devices. In one embodiment, a release layer is applied to a handler. The release layer comprises at least one additive that adjusts a frequency of electro-magnetic radiation absorption property of the release layer. The additive comprises, for example, a 355 nm chemical absorber and/or chemical absorber for one of more wavelengths in a range comprising 600 nm to 740 nm. The at least one singulated semiconductor device is bonded to the handler. The at least one singulated semiconductor device is packaged while it is bonded to the handler. The release layer is ablated by irradiating the release layer through the handler with a laser. The at least one singulated semiconductor device is removed from the transparent handler after the release layer has been ablated.

Various embodiments process semiconductor devices. In one embodiment, a release layer is applied to a handler. The release layer comprises at least one additive that adjusts a frequency of electro-magnetic radiation absorption property of the release layer. The additive comprises, for example, a 355 nm chemical absorber and/or chemical absorber for one of more wavelengths in a range comprising 600 nm to 740 nm. The at least one singulated semiconductor device is bonded to the handler. The at least one singulated semiconductor device is packaged while it is bonded to the handler. The release layer is ablated by irradiating the release layer through the handler with a laser. The the at least one singulated semiconductor device is removed from the transparent handler after the release layer has been ablated.

Various embodiments process semiconductor devices. In one embodiment, a release layer is applied to a handler. The at least one singulated semiconductor device is bonded to the handler. The at least one singulated semiconductor device is packaged while it is bonded to the handler. The release layer is ablated by irradiating the release layer through the handler with a laser. The the at least one singulated semiconductor device is removed from the transparent handler after the release layer has been ablated.

A semiconductor structure includes a thin-film device layer, an optoelectronic device disposed in the thin-film device layer, and a surrogate substrate permanently attached to the thin film device layer. The optoelectronic device is excitable by light at an application wavelength. The surrogate substrate is optically transparent and has a thermal conductivity of at least 300 W/m-K. The surrogate substrate has a volume of substrate removed therefrom to form a via. Light passes through the via and at least some of the surrogate substrate prior to reaching the optoelectronic device.

Device layer thin-film transfer to thermally conductive substrate

After bonding a second substrate to a first substrate through a bonded material layer to provide a bonded structure, through dielectric via (TDV) openings of different depths are concurrently formed in the bonded structure by performing a single anisotropic etch using fluorine-deficient species that are obtained by dissociation of fluorocarbon-containing molecules.

Rapid oxide etch for manufacturing through dielectric via structures

A semiconductor structure includes a thin-film device layer, an optoelectronic device disposed in the thin-film device layer, and a surrogate substrate permanently attached to the thin film device layer. The surrogate substrate is optically transparent and has a thermal conductivity of at least 300 W/m-K. The optoelectronic device excitable by visible light transmitted through the surrogate substrate.

A technique relates to an integrated nanofluidic device. A loading layer includes an inlet channel reservoir, a diverted fraction reservoir, and a passed fraction reservoir. A sorting layer is attached to the loading layer such that fluid is permitted to communicate between the loading and sorting layers, where the sorting layer includes a bank of sorting elements. The sorting layer has inlet channels and outlet channels connected to the sorting elements, and the inlet channel reservoir is connected to the inlet channels by an inlet feed hole. The diverted fraction reservoir is connected to the outlet channels by a diverted fraction outlet feed hole, and the passed fraction reservoir is connected to the sorting elements by passed fraction feed holes. The passed fraction feed holes are respectively connected to the sorting elements.

Growing community of inventors

Medford, MA, United States of America

Cornelia Tsang Yang