Taiwan Semiconductor Manufacturing Comp. Ltd.

Cormac Michael Oconnell

Sergiy Romanovskyy

In a method, error detection and correction is performed on output data from a memory cell of a memory device to generate a result of error detection and correction. The memory cell is determined as a weak cell by determining a number of times of data retention failures of the memory cell based on the result of the error detection and correction. In a refreshing cycle, normal cells and the weak cell are refreshed and the weak cell is additionally refreshed at least once.

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Cormac Michael Oconnell