International Business Machines Corporation

Johnson and Johnson Vision Care, Inc.

Corey Kenneth Barrows

Stephen Gerard Shuma

Paul Steven Zuchowski

Douglas Willard Stout

Peter Albert Twombly

Douglas Wayne Kemerer

Mark Steven Styduhar

Kenneth Joseph Goodnow

Oscar Conrad Strohacker

Edward J Nowak

Adam Toner

Joseph Andrew Iadanza

Scott R Humphreys

Steven Hoggarth

Randall Braxton Pugh

George A Zikos

Robert Karl Schweickert

John Rocco Robillotto

Douglas W Sinut

The present disclosure relates to sensor systems for electronic ophthalmic devices. In certain embodiments, the sensor systems may comprise a sensor such as an adjustable resistor configured in series with an eye of a user of the electronic ophthalmic device. The sensor systems may comprise a gain stage configured to amplify a signal indicative of a difference between a voltage drop across the eye and the adjustable resistor. The sensor systems may comprise an integrator configured to integrate the amplified signal. A resistance value of the adjustable resistor is configured to cancel a DC component of a resistance of the eye when an electrical current is caused to flow through the eye and the adjustable resistor. As such, the configured resistance value of the adjustable resistor is indicative of an impedance of the eye.

Impedance sensing circuits for ophthalmic devices

An anti-aliasing photodetector system for a powered ophthalmic device, such as a contact lens, may be utilized for any number of functions. The anti-aliasing photodetector system converts current from an array of photodetectors into a voltage for use in other aspects of the powered ophthalmic device. The anti-aliasing photodetector system comprises a photodiode array including a plurality of individual photodiodes, an integrate-and-hold circuit, including a capacitor and switch to convert current to voltage, and an analog-to-digital converter. The anti-aliasing photodetector system provides for low power consumption, a wide dynamic range, noise rejection, and is capable of detecting incident ambient visible light as well as incident infrared light.

Anti-aliasing photodetector system

Disclosed are embodiments of a design structure transistor that operates as a capacitor and an associated method of tuning capacitance within such a capacitor. The embodiments of the capacitor comprise a field effect transistor with front and back gates above and below a semiconductor layer, respectively. The capacitance value exhibited by the capacitor can be selectively varied between two different values by changing the voltage condition in a source/drain region of the transistor, e.g., using a switch or resistor between the source/drain region and a voltage supply. Alternatively, the capacitance value exhibited by the capacitor can be selectively varied between multiple different values by changing voltage conditions in one or more of multiple channel regions that are flanked by multiple source/drain regions within the transistor. The capacitor will exhibit different capacitance values depending upon the conductivity in each of the channel regions.

Tunable capacitor

A circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes an input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line.

On-demand power supply current modification system and method for an integrated circuit

A design structure for a circuit that selectively connects an integrated circuit to elements external to the integrated circuits. The circuit includes and input/output element that selectively connects an input/output pin as a function of a power requirement or a signal bandwidth requirement of the integrated circuit. The input/output element includes one or more switching devices that connect the input/output pin to an external element, such as a power supply or external signal path. The input/output element also includes one or more switching devices that connect the input/output pin to an internal element, such as a power network or internal signal line.

Structure for an on-demand power supply current modification system for an integrated circuit

A design structure integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC system architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-chip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributors; the noise event arbiter determining when each noise contributor may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributor as to when permission is granted to execute its operations.

Structure for system architectures for and methods of scheduling on-chip and across-chip noise events in an integrated circuit

Disclosed are embodiments of a transistor that operates as a capacitor and an associated method of tuning capacitance within such a capacitor. The embodiments of the capacitor comprise a field effect transistor with front and back gates above and below a semiconductor layer, respectively. The capacitance value exhibited by the capacitor can be selectively varied between two different values by changing the voltage condition in a source/drain region of the transistor, e.g., using a switch or resistor between the source/drain region and a voltage supply. Alternatively, the capacitance value exhibited by the capacitor can be selectively varied between multiple different values by changing voltage conditions in one or more of multiple channel regions that are flanked by multiple source/drain regions within the transistor. The capacitor will exhibit different capacitance values depending upon the conductivity in each of the channel regions.

A design structure. The design structure includes: a first set of FETs having a designed first Vt and a second set of FETs having a designed second Vt, the first Vt different from the second Vt; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit configured to generate a compare signal based on a performance measurement of the first monitor circuit and of the second monitor circuit; a control unit responsive to the compare signal and configured to generate a control signal regulator based on the compare signal; and an adjustable voltage regulator responsive to the control signal and configured to voltage bias wells of FETs of the second set of FETs, the value of the voltage bias applied based on the control signal.

Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applications

A circuit and a method for adjusting the performance of an integrated circuit, the method includes: comprising: (a) measuring the performance of a first monitor circuit having at least one field effect transistor (FET) of a first set of FETs, each FET of the first set of FETs having a designed first threshold voltage; (b) measuring the performance of a second monitor circuit having at least one field effect transistor (FET) of a second set of FETs, each FET of the second set of FETs having a designed second threshold voltage, the second threshold voltage different from the first threshold voltage; and (c) applying a bias voltage to wells of the FETs of the second set of FETs based on comparing a measured performance of the first and second monitor circuits to specified performances of the first and second monitor circuits.

Methods to reduce threshold voltage tolerance and skew in multi-threshold voltage applications

Disclosed herein is a system for controlling power supply voltage to an on-chip power distribution network. The system incorporates a programmable on-chip sensing network that can be selectively connected to the power distribution network at multiple locations. When the sensing network is selectively connected to the power distribution network at an optimal sensing point, a local voltage feedback signal from that optimal sensing point is generated and used to adjust the power supply voltage and, thus, to manage voltage distribution across the power distribution network. Additionally, the system incorporates a policy for managing the voltage distribution across the power distribution network, a means for profiling voltage drops across the power distribution network and a means for selecting the optimal sensing point based on the policy and the profile. Another embodiment of the system can further control power supply voltages to multiple power distribution networks on the same chip.

Programmable on-chip sense line

Integrated circuit (IC) system architectures that allow for the reduction of on-chip or across-chip transient noise budgets by providing a means to avoid simultaneous high current demand events from at least two functional logic blocks, i.e., noise contributors, are disclosed. Embodiments of the IC systems architectures include at least one noise event arbiter and at least two noise contributor blocks. A method of scheduling on-clip noise events to avoid simultaneous active transient noise events may include, but is not limited to: the noise event arbiter receiving simultaneously multiple requests-to-operate from multiple noise contributers; the noise event arbiter determining when each noise contributer may execute operations based on a pre-established dI/dt budget; and the noise event arbiter notifying each noise contributer as to when permission is granted to execute its operations.

System architectures for and methods of scheduling on-chip and across-chip noise events in an integrated circuit

A circuit and a method for adjusting the performance of an integrated circuit, the circuit includes: first and second sets of FETs having respective first and second threshold voltages, the first threshold voltage different from the second threshold voltage; a first monitor circuit containing at least one FET of the first set of FETs and a second monitor circuit containing at least one FET of the second set of FETs; a compare circuit adapted to generate a compare signal based on a performance measurement of the first monitor circuit and a performance measurement of the second monitor circuit; and a control unit adapted to generate a control signal to a voltage regulator based on the compare signal, the voltage regulator adapted to supply a bias voltage to wells of FETs of the second set of FETs, the value of the bias voltage based on the control signal.

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Colchester, VT, United States of America

Corey Kenneth Barrows