Lsi Logic Corporation

Lsi Corporation

Avago Technologies General IP (singapore) Pte. Ltd.

Coralyn S Gauvin

Gabriel Leandro Romero

Brian A Day

William K Petty

Brian K Herbert

Paul Jeffrey Smith

Joy F Godbee

A test pattern is encoded using a run length limited line encoding to produce an encoded block of data. The encoded block of data is sent via a channel. A plurality of bits in the received block of data that are subsequent to a maximum length run in the sent data is compared to an expected plurality of bits. A type of bit error is classified based on a mismatch between the expected plurality of bits and the plurality of bits in the received block of data.

Classifying bit errors in transmitted run length limited data

Decision modules are strategically located along with various modules to route signals from either a test pattern generator or the data link layer through the various modules for performing scrambling, encoding, and serializing procedures on the signals before transmission of the signals on a serial bus. Decision modules are strategically placed along with various modules to route signals to either a test pattern checker or the data link layer through the various modules for performing descrambling, decoding, and deserializing procedures on the signals after receiving the signals from a serial bus.

Data path utilization for low level pattern generation and checkiing

The present invention provides systems, devices and methods for generating user-defined test patterns within serial controller to facilitate signal testing and verification. These user-defined test patterns may be generated to more accurately reflect the actual traffic of a device-under-test or system, as well as allow a test engineer to more accurately test the boundaries of the device or system. In various embodiments of the invention, a programmable patterns generator is provided for generating user-defined test patterns that may be used during a testing procedure. This programmable pattern generator allows a user to define a particular test pattern by providing bit-by-bit test values, by defining a combination of canned sequences, or by supplementing one or more canned sequences with additional test bits.

Complex pattern generator for analysis of high speed serial streams

A system and method for testing a device with multiple interfaces by generating a predetermined data pattern within the device, transmitting the pattern to a test analyzer, generating a second predetermined data pattern within the test analyzer, and simultaneously transmitting the second test pattern to the device where the second test pattern is verified. The first and second test patterns may be the same or different, depending on the application. Further, the transmit and receive paths may be tested separately and independently in addition to simultaneously.

Self verifying communications testing

In an integrated circuit, test signals are routed from test points through a hierarchy of distributed multiplexers to output pads. The multiplexers are distributed locally to various regions that are arranged in a hierarchy of regional levels. Thus, each test signal is routed to the locally distributed multiplexer, and only a portion of the test signals reach the top-level multiplexer.

Routing of test signals of integrated circuits

A method for defining electrical components enables a layout tool to include functionally extraneous cells in an integrated circuit design without significant adverse impact to the operation of the logically functional cells. The method defines the description of a first functionally extraneous cell for a layout tool so an initial layout of the die produced by the layout tool does not functionally couple the first functionally extraneous cell to a second functionally extraneous cell. The description of the functionally extraneous cell is altered so that the layout tool produces a second layout of the die that functionally couples the first and second functionally extraneous cells without altering the position of the second functionally extraneous cell with respect to a logically functional cell. The description of the functionally extraneous cell complies with the description constraints for cells. However, by describing the functionally extraneous cell so that it is first lacks a functional coupling to another extraneously functional cell and then changing the description to functionally couple the two cells, the position of the second functional cell with respect to a functional cell remains unchanged. In this manner, the advantages of the layout tool may be used to most efficiently locate the cells of the logically functional cells and then couple test circuitry or other functionally extraneous circuits without adversely impacting the operation of the functional logic in a significant way.

System and method for efficient layout of functionally extraneous cells

An integrated circuit device with reduced noise is described. In traditional simultaneous output switching integrated circuits the noise is proportional to the number of concurrently switching outputs. This excessive supply noise can cause the integrated circuit to malfunction through the loss of data. In the present invention, switching supply noise is reduced in the device without increasing the number of input-output pins by synchronously skewing the output driver. In a preferred embodiment, flip-flops are used to control the phase of the switching outputs in order to reduce the noise and instantaneous power by the number of phase assignments.

IO power management: synchronously regulated output skew

A precision delay circuit having two delay chains to provide equal delay periods is described. A rising edge of an input pulse signal is supplied to the first delay chain and the falling edge is supplied to the second delay chain. The resultant output signal maintains the pulse width of the input signal and pulse distortion is minimized. In another aspect, a delay circuit for generating a delayed assertion signal that does not maintain the width of the original input signal pulse and which is substantially immune to noise problems is described. An assertion edge of a resultant pulse is timed by the incoming pulse, but the de-assertion edge is timed by the delayed de-assertion edge of the incoming pulse.

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Colorado Springs, CO, United States of America

Coralyn S Gauvin