Apple Inc.

Multigig, Inc.

Conrad Havluj Ziesler

Daniel C Murray

John H Mylius

Jong-Suk Lee

Rohit Kumar

Toshinari Takayanagi

Vincent R Von Kaenel

Shingo Suzuki

Timothy John Millet

Brian J Campbell

Zongjian Chen

Jung Wook Cho

Matthias Knoth

Jason M Kassoff

Herbert Lopez-Aguado

Jung-Cheng Yeh

Shun Wai (“Dominic”) Go

An integrated circuit may include multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances.

Dynamic voltage margin recovery

An integrated circuit may include multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g., to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

An integrated circuit includes multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g. to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

In an embodiment, an integrated circuit includes multiple instances of a component (e.g. a processor) and a control circuit. The instances may be configured to operate in various modes. Some of the modes are incapable of presenting a worst-case load on the power supply. The control circuit may be configured to monitor the instances and detect the modes in which the instances are operating. Based on the monitoring, the control circuit may request to recover a portion of the voltage margin established for worst-case conditions in the instances. If the instances are to change modes, they may be configured to request mode change from the control circuit. If the mode change causes an increase in the current supply voltage magnitude (e.g. to restore some of the recovered voltage margin), the control circuit may cause the restore and permit it to complete prior to granting the mode change.

In an embodiment, an integrated circuit includes a first circuit and a characterization circuit to capture a histogram of the supply voltage magnitude to the first circuit (or other characteristics of the first circuit). In various embodiments, the characterization circuit may: be located near the first circuit; include a sample/hold circuit that may sample the supply voltage in a short window of time and an ADC that is configured to converge to the sampled voltage over multiple orders of magnitude longer than the short window; be relatively small and low power; capture multiple histograms, e.g. one for each mode of the first circuit; support a blackout interval during mode changes; support a zoom feature to a subrange of supply voltage disabled with fine-grain histogram buckets; and/or include one or more comparators to detect maximum and/or minimum voltages experienced over a time interval.

Integrated characterization circuit

In an embodiment, an integrated circuit comprises a decrypt unit configured to decrypt an encrypted, compressed video stream; an on-chip buffer; and a decompressor coupled to the decrypt unit and the on-chip buffer. The decompressor is configured decompress the video stream, and to store a first portion of each of a first plurality of frames decompressed from the video stream in the on-chip buffer. The decompressor is further configured to store a remaining portion of each of the first plurality of frames in an external memory, wherein each frame as stored in the external memory is incomplete because the first portion is not stored in the external memory.

Eliminating plaintext video from external memory

A system and method for efficiently synchronizing multiple processing cores on a system-on-a-chip (SOC). A SOC includes an interrupt controller and multiple processing cores. The interrupt controller includes a main time base counter. The SOC includes multiple local time base counters, each coupled to a respective one of the processing cores. Synchronization logic blocks are used to update the local counters. These blocks receive a subset of bits from the interrupt controller. The subset of bits represents a number of least significant bits of the main counter less than a total number of bits for the main counter. The logic blocks update an associated local counter according to changes to the received subset of bits. A difference may exist between values of the main counter in the interrupt controller and the local counter in the processing core. However, this difference may be a constant value.

Controller core time base synchronization

A system and method for dithering a clock signal during idle times is disclosed. An integrated circuit (IC) includes a number of functional units and a clock tree. The clock tree includes a root level clock-gating circuit, a number of regional clock-gating circuits, and a number of leaf level clock-gating circuits. The root level clock-gating circuit is coupled to distribute an operating clock signal to the regional clock-gating circuits, while the regional clock-gating circuits are each configured to distribute the operating clock signal to correspondingly coupled ones of the leaf level clock-gating circuits. The IC may further include a control unit configured to monitor activity levels and indications from each of the functional units. The control unit may cause the root clock-gating circuit to dither the clock signal if the IC is idle, wherein dithering includes reducing the duty cycle and the effective frequency of the operating clock signal.

Regional clock gating and dithering

A system, apparatus, and method for writing trace data to storage. Trace data is captured from one or more processors, and then the trace data is written to a trace buffer. The trace data includes program counters of instructions executed by the processors and other debug data. A direct memory access (DMA) controller in a non-real-time block of the system reads trace data from the trace buffer and then writes the trace data to memory via a non-real-time port of a memory controller.

Non-intrusive processor tracing

In an embodiment, an integrated circuit comprises a decompressor, an encrypt unit, and an on-chip image buffer coupled to the decompressor and the encrypt unit. The decompressor is configured to receive a compressed video stream, and to reconstruct a first frame of the video stream in the on-chip buffer. The encrypt unit is configured to generate one or more pixel block streams from pixel blocks of the first frame in the on-chip buffer according to sequence data describing an order of access of the pixel blocks to reconstruct subsequent frames of the video stream. The sequence data was previously generated via processing of the video stream by the integrated circuit, and the encrypt unit is configured to encrypt the pixel block streams to be written to an external memory. In an embodiment, an integrated circuit comprises a decrypt unit configured to decrypt an encrypted, compressed video stream; an on-chip buffer; and a decompressor coupled to the decrypt unit and the on-chip buffer. The decompressor is configured decompress the video stream, and to store a first portion of each of a first plurality of frames decompressed from the video stream in the on-chip buffer. The decompressor is further configured to store a remaining portion of each of the first plurality of frames in an external memory, wherein each frame as stored in the external memory is incomplete because the first portion is not stored in the external memory.

A memory may include a memory array, a plurality of control circuits, and a plurality of isolation circuits. The plurality of control circuits may be configured to generate control signals for the memory array. For example, the plurality of control circuits may include a plurality of word line driver circuits. The plurality of isolation circuits may be configured to receive the control signals from the plurality of control circuits and a plurality of isolation signals. A first isolation signal may correspond to the plurality of word line driver circuits and at least one second isolation signal may correspond to other ones of the plurality of control circuits. The first isolation signal and the second isolation signal may be independently controlled during memory tests to detect stuck-at faults associated with the plurality of isolation signals.

Performing stuck-at testing using multiple isolation circuits

In an embodiment, an integrated circuit includes a power gated block and a power manager circuit. The power manager circuit is configured to provide a block enable signal and at least one select signal to the power gated block. The power manager may generate the select signal responsive to various parameters that affect the speed of the integrated circuit, such as power supply voltage magnitude, operating temperature, and/or process corner. The power gated block may control the rate at which power switches are enabled based on the select signal or signals. For example, the power switches may be enabled in a more parallel or more serial fashion and/or the drive strength of block enable buffering to the power switches may be varied. In another embodiment, the power manager circuit may assert multiple block enables to the power gated block (which are connected to separate sets of power switches), and may control the timing of assertion of the enables to control the rate at which power switches are enabled.

Power switch ramp rate control using programmable connection to switches

In an embodiment, an integrated circuit may include one or more power managed blocks and a power manager circuit. The power manager circuit may be configured to generate a block enable for each power managed block and a block enable clock. The power managed block may generate local block enables to various power switches in the power managed block, staggering the block enables over two or more block enable clock cycles. In particular, the power managed block may include a set of series-connected flops that receive the block enable from the power manager circuit. The output of each flop may be coupled to a respective set of power switches and may enabled those switches. The change in current flow due to enabling and/or disabling the power managed block may thus be controlled. In an embodiment, the frequency of the block enable clock may be set to a defined value independent of process, voltage, and temperature conditions in the integrated circuit.

Growing community of inventors

Seattle, WA, United States of America

Conrad Havluj Ziesler