University of California

Connor J Randall

Paul K Hansma

Daniel C Bridges

Barney Drake

Kenneth Kosik

Luke S K Theogarajan

Kenneth R Tovar

A Neural Circuit Probe (NCP) combines a multi-electrode array (MEA) with an automated local probe, wherein the probe is positioned to interact with one or more cells, such as neurons of a neural circuit, grown on or about one or more electrodes of the multi-electrode array. The probe may interact with the cells by electrically recording signals from the multi-electrode array that are assigned to a specific one of the cells. The probe may interact with the cells by locally delivering chemicals to the cells, which transiently and reversibly modulate the electrical behavior of the cells. The probe may interact with the cells by harvesting the cells using a pipette, so that the harvested cells can be sequenced.

Neural circuit probe

The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in.

Self-aligning probes and related devices

Growing community of inventors

Goleta, CA, United States of America

Connor J Randall