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Concetta Di Tuoro

Demetrio Pellicone

Marco Roveda

Adamo Corsi

Procolo Carannante

Gianfranco Ferrante

A method of managing fails in a non-volatile memory device including an array of cells grouped in blocks of data storage cells includes defining in the array a first subset of user addressable blocks of cells, and a second subset of redundancy blocks of cells. A third subset of non-user addressable blocks of cells is defined in the array for storing the bad block address table of respective codes in an addressable page of cells of a block of the third subset. Each page of the third subset is associated to a corresponding redundancy block. If during the working life of the memory device a block of cells previously judged good in a test phase becomes failed, each block is marked as bad and the stored table in the random access memory is updated.

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80040 Pollena Trocchia, Italy

Concetta Di Tuoro