Datacolor Holding Ag

Colman F Shannon

David Slocum

Brian Levey

Michael Vhrel

Cormic K Merle

Hong Wei

Michael H Brill

Michael J Vrhel

Dana Gregory

The present invention is directed to systems and methods to implement improved and more accurate measurements of the color display characteristics of a display device under analysis. Specifically, the apparatus and method of the present invention are configured to reduce the amount of off-axis light in such a way as to limit the impact of such light on the measurement of color values generated by the display device. The reduction is achieved by causing the display to emit a target radiation only the size and shape of the active area of the sensor.

Method and system for obtaining color measurement of a display screen

One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring spectral sensitivities of at least four channels of a more-than-three-channel sensor in the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to Commission International de l'&#xc9;clairage (CIE) color matching functions, wherein the linearly regressing is performed using a weighting function that is based on a square root of a spectral power distribution characteristic of the emissive display or of a type of the emissive display, and computing a set of initial fitting coefficient values from the linearly regressing.

Method and apparatus for calibrating a color measurement device

One embodiment of a method for calibrating a test color measurement device in conjunction with an emissive display includes measuring initial spectral sensitivities of at least four channels of the test color measurement device, linearly regressing the spectral sensitivities to a least-square best fit to CIE color matching functions, measuring CIE tristimulus values of test colors on the display using a reference color measurement device, measuring the CIE tristimulus values on the display using the test color measurement device, transforming the CIE tristimulus values measured by the test color measurement device to CIE tristimulus values that would have been measured by the reference color measurement device, using a nonlinear function with variable fitting coefficients, and storing initial fitting coefficient values that provide a least-square best fit of the CIE tristimulus values measured by the test color measurement device and the CIE tristimulus values measured by the reference color measurement device.

Method and apparatus for calibrating a display-coupled color measuring device

A tristimulus colorimeter on a single semiconductor chip having at least three detectors, each detector being coated by colorant filters, each filter having at least one layer and at least one filter having a double layer is provided. The colorimeter determines CIE tristimulus values of an incident light from inputs to the filters and detectors. Colorimeters having integral dye filters may be constructed on a single silicon chip embodying all the detectors and electronics, coated over each detector by a deposited filter layer. Colorants may be directly deposited on the detectors, rather than using a plastic substrate for a filter.

Tristimulus colorimeter having integral dye filters

A method for determining the optimal colorant thicknesses and linear combinations for integral illuminant-weighted CIE color-matching filters is provided. A reflectance colorimeter for configuring printers may be designed using this method.

Method for designing a colorimeter having integral illuminant-weighted CIE color-matching filters

A tristimulus colorimeter for measuring reflective or transmissive materials is provided. The colorimeter measures a sample under a calibrated light source, receives inputs to detectors, and determines CIE tristimulus values of the same sample as they would occur under a reference light source. The colorimeter includes a calibrated light source and a single silicon chip that includes three or more detectors. Each detector is permanently coated by a different mix of dyes or other colorants that form a wavelength-selective filter. A single silicon chip embodies all the detectors and electronics, with each detector coated over by deposited filter layers.

Reflectance sensor for integral illuminant-weighted CIE color matching filters

A method for determining the optimal colorant thicknesses for integral CIE color-matching filters is provided. According to a computational study, a four band filter of the present invention provides a best approximation to the CIE XYZ color-matching functions with the least cost.

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Lawrenceville, NJ, United States of America

Colman F Shannon