Johns Hopkins University

Collyn J Heier

Soumyadipta Acharya

Margaret Glancey

Adam C Goodwin

Laura Elizabeth Schiffrin Scavo

Tristan Ford

Jewell Brey

An insect trap analysis system may detect an insect specimen on a trap mechanism of an insect trap. The insect trap analysis system may control, based on detecting the insect specimen on the trap mechanism, one or more mechanical devices to: adjust a position of the insect specimen relative to a position of an image capture device associated with the insect trap, or adjust the position of the image capture device relative to the position of the insect specimen. The insect trap analysis system may cause, while controlling the one or more mechanical devices to adjust the position of the image capture device or the position of the insect specimen, the image capture device to capture a plurality of images of the insect specimen from a plurality of different angles relative to the insect specimen, and may perform an action associated with the plurality of images.

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Cambridge, MA, United States of America

Collyn J Heier