Fei Comapny

Mks Instruments, Inc.

Carl Zeiss Nts Gmbh

Carl Zeiss Microscopy Gmbh

University of North Carolina at Greensboro

Colin Sanford

Mark D DiManna

Steven Berger

Raymond Hill

Bart Buijsse

Cornelis Sander Kooijman

Lawrence Scipioni

Kevin Wenzel

Hendrik Gezinus Tappel

Michael Tanguay

Sander Richard Marie Stoks

Martinus Petrus Maria Bierhoff

Hugo Van Leeuwen

Ben Jacobus Marie Bormans

Koen Arnoldus Wilhelmus Driessen

John Anthony Notte, Iv

Atul Gupta

Mohammad Kamarehi

Johannes Antonius Hendricus W G Persoon

Olivia Keller

Ken Trenholm

Joshua Lamontagne

Billy W Ward

Randall G Percival

Alexander Groholski

Adam R Hall

Johannes Antonius Hendricus Wilhelmus Gerardus Persoon

David C Ferranti

Johannes Antonius Hendricus Wg Persoon

Jijin Yang

Alexander Grohloski

Mart Petrus Maria Bierhoff

Cornelis Sander Kees Kooijman

Kees Kooijman

Ken Trenhom

Mart Bierhoff

A microwave system has a solid-state generator which generates microwave energy and includes at least one control input for receiving a control signal to vary electrically a parameter of the microwave energy. A microwave load receives the microwave energy and produces an effect in response to the microwave energy. A microwave conducting element couples the microwave energy to the microwave load. An impedance match adjusting device is coupled to the microwave conducting element to vary at least one of the parameters of the microwave energy. The effect produced in response to the microwave energy is altered by both electrical variation of the parameter of the microwave energy via the control signal and adjustment of the impedance match adjusting device to vary the parameter of the microwave energy.

Microwave applicator with solid-state generator power source

An apparatus and method for determining the health of a plasma system by igniting a plasma within a plasma confining volume generate an ignition signal with an ignition circuit and apply the ignition signal between a biased region and a grounded region in the vicinity of the plasma confining volume. A parameter in the ignition circuit is sensed, and the sensed parameter is compared to a first parameter threshold. A condition associated with the plasma confining volume is determined if the sensed parameter differs from the first voltage threshold, and a corrective action can be taken.

Apparatus and method for ignition of a plasma system and for monitoring health of the plasma system

A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively.

User interface for an electron microscope

In one aspect, methods of nanopore formation in solid state membranes are described herein, In some embodiments, a method of forming an aperture comprises providing at least one solid state membrane in a chamber, selecting a first dose of ions sufficient to provide a first aperture of predetermined diameter through the membrane and exposing a surface of the membrane at a first location to the first dose of ions in a focused ion beam having a focal point of diameter less than or equal to about 1 nm to remove material from the membrane at the first location thereby providing the first aperture having the predetermined diameter or substantially the predetermined diameter.

Nanopore fabrication and applications thereof

Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like).

Ion sources, systems and methods

A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

Dual beam system

A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder.

Compact scanning electron microscope

Disclosed are charged particle systems that include a tip, at least one gas inlet configured to supply gas particles to the tip, and a element having a curved surface positioned to adsorb un-ionized gas particles, and to direct desorbing gas particles to propagate toward the tip. The charged particle systems can include a field shunt connected to the tip, and configured to adjust an electric field at an apex of the tip.

Increasing current in charged particle sources and systems

An improved simulator for an analytical instrument that provides the student with an experience similar to that of operating the actual instrument. In one preferred embodiment, the invention combines real functionality and simulated functionality where at least one function of the analytical instrument is real. In another preferred embodiment, the invention combines a functional first instrument along with a simulation of a second instrument, the simulation including both hardware with limited functionality and software that simulates the output of a functional instrument to create a teaching aid for use in classrooms and teaching laboratories.

Combined hardware and software instrument simulator for use as a teaching aid

Growing community of inventors

Atkinson, NH, United States of America

Colin Sanford