Stmicroelectronics (Research & Development) Limited

Colin McGarry

Ewan Findlay

Gilles Dufaure De Lajarte

An image assembly may include a substrate having a face, a first optical layer and at least one spacer member. The imaging assembly may also include an anti-reflection structure. The at least one spacer member may be arranged between the substrate and the first optical layer to define an air gap therebetween. The anti-reflection structure may be coupled to at least part of the face and at least one of the first optical layer and the at least one spacer member. The anti-reflection structure may also include a plurality of projections having dimensions smaller than a wavelength of radiation to be imaged by the imaging assembly.

Imaging assembly

An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.

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Broxburn, United Kingdom

Colin McGarry