Koninklijke Philips Corporation N.v.

Coen Adrianus Johannes Verschuren

Josephus Arnoldus Henricus Maria Kahlman

Albert Hendrik Jan Immink

Mischa Megens

Bart Michiel De Boer

Theodorus Petrus Henricus Gerardus Jansen

Jeroen Veen

A sensor device and a method for the determination of the amount of target particles at a contact surface adjacent to a sample chamber include detecting, by a detector, the target particles in the sample chamber by a sensor element, and providing at least one corresponding sensor signal. An evaluation unit determines the amount of target particles in a first zone at the contracts surface and in a second zone a distance away from the contact surface based on this sensor signal. In an optical measurement approach, frustrated total internal reflection taking place under different operating conditions, such as wavelength and/or angle of incidence, may be used to extract information about the first and second zones. In a magnetic measurement approach, different magnetic excitation fields may be used to excite magnetic target particles differently in the first and second zone.

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Eindhoven, Netherlands

Coen Adrianus Johannes Verschuren