Seagate Technology Incorporated

Clifford Jayson Bringas Camalig

Mui Chong Chai

ChengYi Guo

Gan Swee Chuan

Quinn Jay Haddock

Richard Edward Martin

Won Choul Yang

Shi Jung Kim

Ju Yong Lee

Kai Yang

Jose Mari Corral Toribio

Asmin Buang

Victor Chew Weng Khin

Lim TeckKhoon

Lim Teck Khoon

Lau Luh Chyuan

KangHai Lim

The disclosure is related to an apparatus and methods for addressing variations in bit error rates amongst data storage segments. In a particular embodiment, an apparatus includes a controller that detects variations in bit error rates amongst different segments of a plurality of segments in a storage medium. The controller also adjusts a read/write operation parameter according to the detected variations amongst the bit error rates in the plurality of segments.

Addressing variations in bit error rates amongst data storage segments

Calibration and calculation of thermal clearance compensation of a head in a storage device without causing contact between the head and a storage medium. The thermal clearance compensation may be configured to compensate for any changing fly height of the head of the storage device during different temperature conditions based on high and low temperature signal data.

Non-contact fly height calibration and compensation

Devices and methods for reducing thermal stress within a head of a storage device are disclosed. In one or more embodiments, a method includes writing a selected pattern to a storage medium of a storage device using a head of the storage device; reading the selected pattern from the storage medium using the head to provide a data signal; and calculating an instability value of the head based on the data signal. The method can further include reconfiguring the storage device if the instability value is greater than an instability threshold by performing at least one of: deactivating a heater if the head includes two or more heaters; and increasing a fly height between the head and the storage medium.

Method of reducing thermal stress within a magnetic head

Technologies are described herein for determining the linear storage density of data tracks on a recording media of a storage device while compensating for segments of the recording media with poor bit-error rates. The sectors of the data track are grouped into a plurality of segments and a bits-per-inch capability ('BPIC') value is determined for each of the plurality of segments based on a target bit-error rate. The lowest segment BPIC value from amongst the plurality of segments is then determined as well as an average BPIC value for the entire data track. The final BPI value for the data track is determined based on the average BPIC value and the lowest segment BPIC value.

Addressing insufficient bit error rates amongst segments

Testing and compensating for fly height of a head in a storage device during settling time using a head for use on a storage medium and a processor to idle the head for an idle time, unload the head from idle, and compensate for any unsettled fly height of the head using the idle time and at least a pre-determined clearance settling function over time from idle.

Head fly height testing and compensation

A filter element includes a flow-through element and a floor element that abut one another to form a crevice along a crevice length between the flow-through element and the floor element. The crevice traps a portion of particles that become dislodged from the flow-through element.

Filter element with particle-trapping crevice

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Singapore, Singapore

Clifford Jayson Bringas Camalig