Google Inc.

Robert Boschgmbh

Xilinx, Inc.

Netlogic Microsystems, Inc

Clemenz Lenard Portmann

Cheng-Yi Andrew Lin

Donald C Stark

Shahriar Rabii

Christoph Lang

Dean Liu

Warren E Cory

An apparatus is described that includes an image sensor and a light source driver circuit integrated in a same semiconductor chip package. The image sensor includes visible light pixels and depth pixels. The depth pixels are to sense light generated with a light source drive signal. The light source drive signal is generated with the light source driver circuit.

Image sensor and light source driver integrated in a same semiconductor package

An apparatus is described that includes an image sensor and a light source driver circuit having configuration register space to receive information pertaining to a command to simulate a distance between a light source and an object that is different than an actual distance between the light source and the object.

Time-of-flight image sensor and light source driver having simulated distance capability

A modulated signal based on a low-precision, fast startup oscillator is provided to a circuit with a high-precision, slow startup oscillator. The frequency of the modulated signal ranges around the characteristic or resonant frequency of the high precision oscillator without using feedback from the high precision oscillator circuit. An implementation can include one or more variable gain circuits that can be adjusted based on an amplitude threshold in relation to the output signal of the high precision oscillator circuit.

Oscillator startup

A clock signal for use by a circuit can be switched between clocks glitchlessly. A series of delay devices are connected in series based on an integral timing ratio. The integral timing ratio can be based on a ratio of the one of the clock's frequency or period to the other's frequency or period. When a clock select signal is received, the select signal is qualified and then delayed an amount of time based on the integral timing ratio, using the delay devices. The number of delay devices in each series can be the next largest integer to the integral timing ratio, plus one. The clock signal can then be glitchlessly switched from one clock to the other.

Methods and systems for switching between clocks

A method and device for testing a digital-to-analog converter is provided. The method may include configuring a decoder to address an individual unit cell of a plurality of unit cells of a digital-to-analog converter. The configured decoder may select a particular unit cell of the plurality of unit cells for testing. The selected unit cell may have digital and analog circuitry. A bias current of the selected unit cell may be increased. The increased bias current of the selected unit cell may be greater during the testing than during normal operation. A test logic signal may be applied to the selected unit cell. In response to the test logic signal, an output signal may be output from the selected unit cell logic circuitry of the digital-to-analog converter. A device may include logic circuitry configured to select an individual unit cell for testing and a current generating circuitry.

Fast test of digital-to-analog converters

In one embodiment, an analog to digital converter includes a comparator having a first input, a second input and an output, the first input being coupled to an analog signal, a successive approximation register having a serial input coupled to the output of the comparator, and being configured to generate a plurality of control signals and an N-bit digital value corresponding to the analog signal, and a digital to analog converter having an input coupled to the plurality of control signals, the digital to analog converter further comprising a first, a second, and a third capacitor and a plurality of switches controlled by the plurality of control signals and being configured to couple the first capacitor to the second capacitor and the third capacitor to the second capacitor mutually exclusively to share charge on the first capacitor and charge on the third capacitor with charge on the second capacitor and to generate an analog signal on the second capacitor, the second capacitor being coupled to the second input of the comparator.

Charge-sharing digital to analog converter and successive approximation analog to digital converter

Data and clock synchronization within a gigabit receiver is maintained throughout the data byte processing logic of the receiver by utilizing the same byte clock signal. The deserialization clock signal that is used to deserialize the received serial data stream is phase coherent with the distributed byte clock signal used within the physical coding sublayer (PCS), thus establishing reliable data transfer across the physical media attachment (PMA) and PCS layers of the gigabit receiver while maintaining a known, fixed latency. The phase relationship between a derived bit clock signal and the byte clock signal is shifted in a manner that achieves coarse data alignment within each data byte without affecting the latency. Conversely, the coarse data alignment is combined with a data alignment toggling procedure to reduce data alignment granularity with minimized latency changes.

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Los Altos Hills, CA, United States of America

Clemenz Lenard Portmann