Atmel Germany Gmbh

Atmel Automotive Gmbh

Clemens Hauser

Arno Soerensen

In one embodiment, a circuit includes a measuring circuit coupled to an accumulator cell. A first output of the measuring circuit outputs a current signal based on a cell voltage of the accumulator cell. The circuit includes an interface circuit coupled to the first output of the measuring circuit and a second output of a level-shifter circuit configured to change a voltage level on the first output at the interface circuit. The level-shifter circuit includes a first input coupled to the first output and one or more transistors coupled in series with one or more gate terminals that are each coupled to each of one or more terminals of the accumulator cell.

Circuit for monitoring of accumulator cells connected in series

A receiver is synchronized with a first clock frequency or signal of a transmitter for the proper reception of transmitted and received signals, such as data carrying signals (DS). The first clock frequency is for example a carrier frequency. A local oscillator generates a second clock frequency or signal in the receiver. Cycles or impulses of the second clock signal are counted between predetermined flanks of the received signal (DS) to provide a count (N). Based on the second clock signal and the count (N) a first ratio (TV) is provided that represents a first ratio between the first clock frequency or signal and the second clock frequency or signal. The first ratio is compared with a predetermined or given second ratio (TV) to provide a comparing result. The predetermined second ratio is then updated in response to the comparing result to provide an updated ratio (TV'). The present circuit is constructed to perform these steps.

Method and circuit arrangement for synchronizing a function unit with a predetermined clock frequency

An integrated circuit is disclosed having at least one digital input, which has a first circuit section that has a current-voltage characteristic and that in the absence of an input signal holds a voltage at the input at a defined value, and having a second circuit section that provides a signal that is internal to the circuit and whose state does not directly show itself at an output of the circuit. The first circuit section has a control input for a control signal and is designed to change its current-voltage characteristic when the control signal is present at the control input. In addition, a method for testing such a circuit is disclosed.

Integrated circuit with integrated circuit section to aid in testing

A constant voltage source is disclosed having an output current control element, which adjusts an output voltage of the constant voltage source by varying its output current, a control circuit, which acquires a measure for an actual value of the output voltage and processes it to a control signal for the control of the output current control element, and a limiting circuit, which limits the output current to a predefined maximum value by action on the control signal, whereby the limitation is independent of an actual value of the output current. Wherein the limiting circuit has a first pair comprising a first transistor and a second transistor and a second pair comprising a third transistor and a fourth transistor, whereby the first and fourth transistor belong to a first conductivity type, the second and third transistor belong to a second conductivity type, operating current paths of the first pair lie in series between a reference current source and a supply potential, the operating current paths of the second pair are integrated in series into the control branch, control terminals of transistors of the same type are connected to one another, control terminals of transistors of the first conductivity type are connected to the reference current source, and control terminals of transistors of the second conductivity type to a first voltage source. Further, a method for generating a load-independent constant output voltage is disclosed.

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Heilbronn, Germany

Clemens Hauser