Taiwan Semiconductor Manufacturing Comp. Ltd.

Chung-Peng Hsieh

Yung-Chow Peng

Chung-Chieh Yang

Chih-Chiang Chang

Chung-Ting Lu

Jaw-Juinn Horng

Po-Nien Chen

Chia-Hsin Hu

Yung-Shun Chen

Yu-Chiun Lin

Yi-Hsuan Chung

Tai-Yi Chen

Nai Chen Cheng

Sa-Lly Liu

Chih-chiang Chang

Chung-Hui Chen

Ruey-Bin Sheen

Wen-Shen Chou

Po-Zeng Kang

Yang Chung-Chieh

A delay-locked loop (DLL) circuit includes a low pass filter coupled to a phase detector, and a digitally controlled delay line (DCDL) coupled to the low pass filter. The DCDL includes an input terminal, an output terminal coupled to an input terminal of the phase detector, and stages that propagate a signal along a first path from the input terminal to a selectable return stage and along a second path from the return stage to the output terminal. Each stage includes first and second inverters that selectively propagate the signal along the first and second paths, a third inverter that selectively propagates the signal from the first path to the second path, and either fourth and fifth inverters that selectively propagate the signal along the first and second paths, or a sixth inverter that selectively propagates the signal from the first path to the second path.

Delay-locked loop circuit and method

A device for measuring characteristics of a wafer is provided. The device includes a first circuit on the wafer and having a first number of parallelly connected oscillators, and a second circuit on the wafer and having the first number of parallelly connected oscillators; wherein a first portion of the second circuit is disconnected from a second portion of the second circuit.

Device and method for measuring characteristics of a wafer

An electronic design flow generates an electronic architectural design layout for analog circuitry from a schematic diagram. The electronic design flow assigns analog circuits of the schematic diagram to various categories of analog circuits. The electronic design flow places various analog standard cells corresponding to these categories of analog circuits into analog placement sites assigned to the analog circuits. These analog standard cells have a uniform cell height which allows these analog standard cells to be readily connected or merged to digital standard cells which decreases the area of the electronic architectural design layout. This uniformity in height between these analog standard cells additionally provides a more reliable yield when compared to non-uniform analog standard cells.

Analog cells utilizing complementary mosfet pairs

A semiconductor device includes a dummy fin structure disposed over a substrate, a dummy gate structure disposed over a part of the dummy fin structure, a first interlayer dielectric layer in which the dummy gate structure is embedded, a second interlayer dielectric layer disposed over the first interlayer dielectric layer, and a resistor wire formed of a conductive material and embedded in the second interlayer dielectric layer. The resistor wire overlaps the dummy gate structure in plan view.

Semiconductor device and a method for fabricating the same

A digitally controlled delay line (DCDL) includes input and output terminals, and a plurality of stages that propagate a signal along a first signal path from the input terminal to a selectable return stage and along a second signal path from the return stage to the output terminal. Each stage includes a first inverter that selectively propagates the signal along the first signal path, a second inverter that selectively propagates the signal along the second signal path, and a third inverter that selectively propagates the signal from the first signal path to the second signal path. At least one of the first or third inverters includes a tuning portion including either a plurality of parallel, independently controllable p-type transistors coupled in series with a single independently controllable n-type transistor, or a plurality of parallel, independently controllable n-type transistors coupled in series with a single independently controllable p-type transistor.

Digitally controlled delay line circuit and method

A device includes a control circuit, a scope circuit, a first logic gate and a second logic gate. The control circuit is configured to generate a first control signal according to a voltage signal and a delayed signal. The scope circuit is configured to generate a first current signal in response to the first control signal and the voltage signal. The first logic gate is configured to perform a first logical operation on the voltage signal and one of the voltage signal and the delayed signal to generate a second control signal. The second logical gate configured to perform a second logical operation on the second control signal and a test control signal to generate a second current signal.

On-chip oscilloscope

A low power comparator and a self-regulated device for adjusting power saving level of an electronic device are provided. The low power comparator includes an input differential pair circuit, a self-regulated device, and a tail current switch. The input differential pair circuit is configured to receive input signals to be compared. The self-regulated device is coupled to the input differential pair circuit and includes a self-regulated circuit which has a first transistor with a first threshold voltage and a second transistor with a second threshold voltage and is configured to adjust a power saving level of the low-power comparator according to the first threshold voltage and the second threshold voltage. The tail current switch is coupled to the input differential pair circuit through the self-regulated circuit to provide a constant current to the input differential pair circuit.

Low power comparator and self-regulated device

A device includes a control circuit, a scope circuit, and a time-to-current converter. The control circuit is configured to receive a voltage signal from a voltage-controlled oscillator, delay the voltage signal for a delay time to generate a first control signal, and to generate a second control signal according to the first control signal and the voltage signal. The scope circuit is configured to generate a first current signal in response to the second control signal and the voltage signal. The time-to-current converter is configured generate a second current signal according to the first control signal, the voltage signal, a first switch signal, and a test control signal.

A digitally controlled delay line (DCDL) includes an input terminal, an output terminal, and a plurality of stages configured to propagate a signal along a first signal path from the input terminal to a selectable return stage of the plurality of stages, and along a second signal path from the return stage of the plurality of stages to the output terminal. Each stage of the plurality of stages includes a first inverter configured to selectively propagate the signal along the first signal path, a second inverter configured to selectively propagate the signal along the second signal path, and a third inverter configured to selectively propagate the signal from the first signal path to the second signal path. Each of the first and third inverters has a tunable selection configuration corresponding to greater than three output states.

A digitally controlled delay line (DCDL) includes an input terminal, an output terminal, and a plurality of stages configured to propagate a signal along a first signal path from the input terminal to a selectable return stage of the plurality of stages, and along a second signal path from the return stage of the plurality of stages to the output terminal. Each stage of the plurality of stages includes first and second inverters configured to selectively propagate the signal along the first signal path, third and fourth inverters configured to selectively propagate the signal along the second signal path, and a fifth inverter configured to selectively propagate the signal from the first signal path to the second signal path.

A device is disclosed that includes a control circuit and a scope circuit. The control circuit is configured to delay a voltage signal to generate a first control signal. The scope circuit is configured to be operated in one of a first mode and a second mode according to the first control signal. In the first mode, the scope circuit is configured to generate a first current signal indicating amplitudes of the voltage signal, and in the second mode, the scope circuit is configured to stop generating the first current signal.

A semiconductor device is disclosed. In one example, the semiconductor device includes: an electronic component having a top surface, a bottom surface, and two end portions; a plurality of contacts disposed on the top surface; and a plurality of metal nodes disposed on the plurality of contacts. The plurality of contacts includes two end contacts disposed at the two end portions respectively and at least one intermediate contact disposed between the two end contacts. The plurality of metal nodes includes two end metal nodes disposed on the two end contacts respectively and at least one intermediate metal node disposed on the at least one intermediate contact.

Growing community of inventors

Taipei, Taiwan

Chung-Peng Hsieh