Apple Inc.

Chung-Lun Edwin Hsu

Hasan Akyol

John T Wetherell

Xuebei Yang

Henry C Jen

Yingkan Lin

Chun-Ming Tang

Patrick B Bennett

Chaohao Wang

Hopil Bae

Derek Keith Shaeffer

Chun-Yao Huang

Sheng Zhang

Baris Cagdaser

Shingo Hatanaka

Xiaofeng Wang

Cheuk Chi Lo

Lingtao Wang

Ali Tabatabaei

Runjie Xu

Systems and methods may reduce or eliminate image artifacts due to a defective pixel of an electronic display. An electronic display may include pixels that respectively include a self-emissive element, pixel drive circuitry that supplies a pixel drive current to drive the self-emissive element, and signal routing circuitry that reduces or eliminates a visual artifact due to a defective pixel among the pixels. The signal routing circuitry may do this by turning off the self-emissive element, supplying image data from the pixel drive circuitry to a first adjacent pixel, or receiving image data from other pixel drive circuitry from the first adjacent pixel or a second adjacent pixel.

Pixel screening and repair

Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.

On-chip testing architecture for display system

Circuitry for screening defective portion of display chip

Growing community of inventors

San Jose, CA, United States of America

Chung-Lun Edwin Hsu