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Pattern Discovery Technologies Inc.

Wong, Andrew

Li, Chung Lam

Chung Lam Li

Andrew Wong

Andrew K Wong

The present invention relates to control, monitoring, and automation. The present invention more specifically relates to pattern-based intelligent control, monitoring and automation. The invention performs pattern-based monitoring. It collects signal data from one or more signals. The signal data define signal data streams. It then transforms each of the signal data streams into trends. It also discovers patterns based on the trends within each signal data stream and/or across the signal data streams. The patterns are optionally used for diagnostics and root cause analysis, online plant monitoring and operation control, plant optimization, and other environments where a causal link or correlation may exist between related inputs, states and/or outputs.

System, method and computer program for pattern based intelligent control, monitoring and automation

In its broad aspect, the invention provides a method for analyzing relationships among patterns within a data set having a set of samples and associated attribute values defining each attribute of each said sample. The method comprises receiving at an input at least two patterns; defining a data cluster within the data set for each of said at least two patterns, each defined data cluster having samples with attribute values associated with a corresponding pattern of said at least two patterns; grouping at least some of the samples of each defined data cluster with one another to generate a resultant data cluster; and calculating a variation between the attribute values of a first set of samples and the attribute values of a second set of samples within said resultant data cluster, the attribute values of the first set of samples and the second set of samples corresponding to the same attribute.

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Waterloo, Canada

Chung Lam Li