General Electric Company

Sabic Innovative Plastics IP B.v.

Chung-hei Simon Yeung

Kevin Patrick Capaldo

Mark Allen Cheverton

Dennis Joseph Coyle

Michael John Davis

Steven Mark Schirle

Jian Zhou

Masako Yamada

Sanjay Bharadwaj

Narayanan Venkateswaran

Andrei Sharygin

Mahari Tjahjadi

Sameer Kirti Talsania

Johnalagadda Venkata Rama Prasad

Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, 'bell-shape' bump and complex lens shape structures.

Display film stacks and a method of modeling the films

A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.

Integrated inspection system and defect correction method

An apparatus for monitoring the health of a compressor having at least one sensor operatively coupled to the compressor for monitoring at least one compressor parameter, a processor system embodying a stall precursor detection algorithm, the processor system operatively coupled to the at least one sensor, the processor system computing stall precursors. A comparator is provided to compare the stall precursors with predetermined baseline data, and a controller operatively coupled to the comparator initiates corrective actions to prevent a compressor surge and stall if the stall precursors deviate from the baseline data, the baseline data representing predetermined level of compressor operability.

Method and apparatus for continuous prediction, monitoring and control of compressor health via detection of precursors to rotating stall and surge

Growing community of inventors

Evansville, IL, United States of America

Chung-hei Simon Yeung