Samsung Electronics Co., Ltd.

Chung-Hee Kim

Min-Su Kim

Dae-Seong Lee

Gun-Ok Jung

Jin-Soo Park

Uk-Rae Cho

Ji-Kyum Kim

Emil Kagramanyan

Matthew S Berzins

Hyun Shik Lee

Rahul Singh

James Jung Lim

Hyoung-Wook Lee

Doo-Seok Yoon

A multi-bit flip-flop includes: a single scan input pin to receive a scan input signal, a plurality of data input pins to receive first and second data input signals, a first scan flip-flop to select one of the scan input signal and the first data input signal as a first selection signal in response to a scan enable signal and to latch the first selection signal to provide a first output signal, a second scan flip-flop to select one of an internal signal corresponding to the first output signal and the second data input signal as a second selection signal in response to the scan enable signal and to latch the second selection signal to provide a second output signal, and a plurality of output pins to output the first and second output signals, wherein scan paths of the first and second scan flip-flops are connected to each other.

Multi-bit flip-flops

Provided are a semiconductor device and a method for operating a semiconductor device. The semiconductor device includes a clock generating unit receiving a reference clock and generating first and second clocks that are different from each other from the reference clock; a first latch configured to receive input data based on the first clock and to output the input data as first output data; and a second latch configured to receive the first output data based on the second clock and to output the first output data as second output data, wherein a first edge of the first clock does not overlap a first edge of the second clock, and at least a part of a second edge of the first clock overlaps a second edge of the second clock.

Semiconductor device and method for operating the same

An example embodiment discloses a flip-flop including a first inverter configured to invert first data, first and second transistors connected to each other in series and configured to receive the inverted first data and a first clock, respectively, a third transistor and a first gate configured to perform a logic operation on the first data and the first clock, the third transistor configured to receive an output of the logic operation. The second transistor and the third transistor are connected to a first node.

Semiconductor circuit and semiconductor system

A scan flip-flop circuit includes a pulse generator, a dynamic input unit and a latch output unit. The pulse generator generates a pulse signal which is enabled in synchronization with a rising edge of a clock signal in a normal mode, and is selectively enabled in synchronization with the rising edge of the clock signal in response to a logic level of a scan input signal in a scan mode. The dynamic input unit precharges a first node to a power supply voltage in a first phase of the clock signal, selectively discharges the first node in the normal mode, and discharges the first node in the scan mode. The latch output unit latches an internal signal provided from the first node to provide an output data, and determines whether the output data is toggled based on the clock signal and a previous state of the output data.

Flip-flop circuit and scan flip-flop circuit

A clock skew controller for adjusting a skew between a first clock, which is input to a first clock mesh, and a second clock mesh input to a second clock mesh, includes a pulse generator adapted to output a pulse signal corresponding to a delay time between a first output clock output from the first clock mesh and a second output clock output from the second clock mesh, a pulse width detector adapted to generate a digital signal corresponding to a pulse width of the pulse signal, and a clock delay adjuster adapted to delay one of the first and second clocks by a time corresponding to the digital signal.

Clock skew controller and integrated circuit including the same

A level shifting circuit includes a first level shifting unit including a plurality of signal transfer units; a first operation control unit inactivating some of signal transfer units of the first level shifting unit in response to a clamping signal; a second level shifting unit connected in parallel to the first level shifting unit and comprising a plurality of signal transfer units; a second operation control unit inactivating some of signal transfer units of the second level shifting unit in response to the clamping signal; a signal output unit connected to output ends of the first and second level shifting units; and a clamping unit fixing the output ends of the first and second level shifting units to a predetermined voltage level in response to the clamping signal.

Growing community of inventors

Yongin-si, South Korea

Chung-Hee Kim