Taiwan Semiconductor Manufacturing Comp. Ltd.

Chung-Chieh Chen

Cheng-Hsiung Kuo

Gu-Huan Li

Yu-Der Chih

Hsu-Shun Chen

Yue-Der Chih

Jih-Chen Wang

Chen-Lun Yen

A memory device includes a column of at least three memory cells and a source line coupled to the source terminal of each memory cell. A source line driver is coupled to the source line, a voltage terminal, and a program voltage source and is switchable between a program operation, an erase operation, and a read operation.

Memory device in which latch is coupled to source line and method of operation

A sense amplifier control system includes a precharge control switch configured to receive a precharge signal. A reference cell is configured to receive a reference word line signal. In a precharge phase, the control switch is controlled in response to the precharge signal to precharge the reference input node to a predetermined precharge level. In a sensing phase subsequent to the pre-charge phase, the trigger circuit is configured to output a triggering signal at the output terminal in response to the reference input node reaching a triggering level.

Sense amplifier control

Memory device comprising source line coupled to multiple memory cells and method of operation

A circuit for generating an output voltage and method for setting an output voltage of a low dropout regulator are provided. A current source is configured to generate a reference current, and an error amplifier has a first input, a second input, and a single-ended output. The first input is connected to a reference voltage, and the second input is connected to an output node of the circuit via a feedback resistor. A pass transistor includes a control electrode connected to the single-ended output of the error amplifier, a first electrode connected to a power supply voltage, and a second electrode connected to the output node of the circuit. A first branch of a current mirror is connected to the current source, and a second branch of the current mirror is connected to the second terminal of the feedback resistor. The output node provides an output voltage of the circuit.

Circuit for generating an output voltage and method for setting an output voltage of a low dropout regulator

A multiple-time programmable (MTP) structure is provided that can operate using a power supply with a supply voltage of 1.5 V to 5.5 V. When the supply voltage is above a first voltage, a first circuit is configured to induce a second constant voltage at a drain of a second transistor, and to induce the second constant voltage on a terminal in a third circuit. In some embodiments, the third circuit provides a third constant voltage on a gate of a third transistor. When the supply voltage is below the first voltage, a fifth circuit is configured to induce a fourth constant voltage on a terminal in the third circuit. The fourth constant voltage is substantially equal to the second constant voltage.

Multiple-time programmable memory

Systems, devices and methods are provided for memory operations. An example system includes: a latch circuit shared by a plurality of memory blocks of a memory device and configured to provide one or more regulation signals for a memory operation; a source line circuit shared by the plurality of memory blocks and configured to provide a source line voltage to the plurality of memory blocks for the memory operation based at least in part on the one or more regulation signals; and a plurality of driver circuits configured to provide a plurality of drive signals to the plurality of memory blocks based at least in part on the one or more regulation signals.

Systems, devices and methods for memory operations

A memory includes a first memory cell, a second memory cell, a latch unit, and a switch unit. The latch unit has a true node and a complement node. The switch unit is responsive to a first control signal and a second control signal, and is configured to connect the first memory cell to the true node and to disconnect the second memory cell from the complement node in response to the first control signal and to connect the second memory cell to the complement node and to disconnect the first memory cell from the true node in response to the second control signal. A semiconductor device that includes the memory is also disclosed. A method for testing the memory is also disclosed.

Memory, semiconductor device including the same, and method for testing the same

An integrated circuit that includes a generator unit connected to one or more pull-up units, one or more pull-up units connected to one or more source lines and an array of memory cells connected to the one or more source lines. The generator unit is configured to set a first voltage signal of each pull-up unit of the one or more pull-up units. Each pull-up unit of the one or more pull-up units is connected with the corresponding source line of the one or more source lines and is configured to set a current of the corresponding source line of the one or more source lines. The array of memory cells is electrically connected to the one or more source lines and one or more bit lines.

Growing community of inventors

Hsinchu, Taiwan

Chung-Chieh Chen