Mediatek Corporation

Industrial Technology Research Institute

Chun-Yen Wu

Li-Ren Huang

Cheng-Han Lee

Chi-Chun Hsu

Po-Sen Huang

Wen-Dar Hsieh

User equipment (UE) for a time-average specific absorption rate (SAR) is provided. The UE includes a processor and a switch circuit. The processor may determine the current frequency band in which the UE is operating and select a code word combination within a unit of time from a plurality of code words based on the current frequency band. The switch circuit is coupled to the processor. The switch circuit may switch to a switch state based on the selected code word combination, wherein each switch state corresponds to a corresponding cord word of the selected code word combination.

Dynamic tuning method for time-average SAR and user equipment thereof

Dynamic tuning method for a specific absorption rate (SAR) is provided. The dynamic tuning method is applied to user equipment (UE). The dynamic tuning method may include the following steps: the UE may determine the back-off value corresponding to the current antenna state; and the UE may tune the conducted power of the radio frequency (RF) circuit of the UE based on the back-off value.

Dynamic tuning method for SAR and user equipment thereof

A testing method for a chip with an embedded non-volatile memory and the chip is provided. A remapping circuit and the non-volatile memory are connected to a processor. The non-volatile memory has a test area and an area under test. The test area stores a test program, and the area under test stores data under test. When the processor tests the chip, the processor outputs an original instruction address, and the remapping circuit remaps the original instruction address to generate a remapped instruction address. The processor reads the test program in the test area, and executes the test program to read the data under test in the area under test and to perform a test of toggling the logic circuit.

Growing community of inventors

Hsinchu, Taiwan

Chun-Yen Wu