International Business Machines Corporation

Chun-Tao Li

Jente Benedict Kuang

Sebastian Ehrenreich

Hung Cai Ngo

Steven John Baumgartner

Salvatore Nicholas Storino

Pernell James Dykes

Mankit Wong

Hung Kai Ngo

An apparatus, program product and method provide on-demand numerical conversion of convertible numerical values such as measurements and monetary values. A numerical value that is displayed in a document such as a web page, and that is represented in a native unit, may be converted to a value represented in a local unit for a user viewing the document. That converted numerical value may then be displayed adjacent the original numerical value, and typically along with an indication of the local unit, in response to the user positioning a pointer over the original (unconverted) numerical value, so that the user can quickly comprehend the numerical value in units to which he or she is accustomed.

On-demand numerical conversion

A storage cell design evaluation circuit including a wordline timing and cell access detection circuit provides accurate information about state changes in static storage cells. A storage cell test row includes the access detection circuit, which provides the same loading during an access operation as the other cells in the array. The access detection circuit provides an output that may be probed without affecting the timing, read stability or writeability of the cell. The test row can test the clock and/or address timing of the row and may include a separate power supply rail for the row wordline driver, so that variation of access timing, read stability and writeability with wordline strength/access voltage can be determined. Multiple test rows may be cascaded among columns to provide a long delay line or ring oscillator for improved measurement resolution.

Storage cell design evaluation circuit including a wordline timing and cell access detection circuit

Disclosed is a metal fill region of a semiconductor chip including a plurality of layer sets of the semiconductor chip, each set including a first metal fill layer, a second metal fill layer, and an insulation layer included disposed in planes parallel to each other, a plurality of metal fill pieces disposed in each of the metal fill layers, a metal fill piece axis of each of the pieces, wherein each of the axes perpendicularly intersects the planes of said metal fill layers and the insulation layer from any point of reference, and a metal fill pattern configured to position the pieces so that the axis of each piece in the first metal fill layer is linearly displaced of the axis of each piece in the second metal fill layer in at least one direction orthogonal to each of the metal fill axes.

Metal fill region of a semiconductor chip

A method for storage cell design evaluation provides accurate information about state changes in static storage cells. A wordline select pulse is propagated along the wordline select path of the test row to an output driver circuit, in order to test the clock and/or address timing of the row, so that variation of access timing, read stability and writeability with wordline strength/access voltage can be determined. An access detection cell holds the input of the output driver circuit until a simulated access operation activated by the wordline select pulse is complete. Multiple test rows may be cascaded among columns to provide a long delay line or ring oscillator for improved measurement resolution.

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Rochester, MN, United States of America

Chun-Tao Li