Armorlink Sh Corp.

Icp Electronics, Inc.

Iei Integration Corp.

Chun-Shun Tseng

Jung-Hua Wang

Hai-Peng Cheng

Shih-Hsun Chen

Yi-Hua Wang

Te-Heng Hsiang

Chang-Te Lin

Shan-Chun Tsai

Ya-Yun Jheng

Chiao-Wei Lin

Ming-Chi Jhuang

Disclosed herein is a method for auto-depicting trends in object contours (referred to as ADTOC). At the heart of ADTOC is a sifting process to determine a significant angular value via evaluating a plurality of angular values in a predefined range. ADTOC is characterized in that a probe-ahead concept is applied to obtain a reference angular value along the current route, and then the probed angular value is used to modify the significant angular value in order to timely correct the subsequent trace direction, thus achieving more accurate trace result. Contours with discontinuous segments caused by noise, obstacles, illumination, shading variations, etc. can also be auto-depicted without requiring a predefined auxiliary route.

Method for auto-depicting trends in object contours

A method for fast locating a decipherable pattern in an input image, which is characterized in utilizing an overly downscaled binary image to not only reduce computation time but also facilitate extraction of skeletons for fast and accurately locating pattern, is disclosed. First, a pre-process is applied to an input image to acquire a binary image downscaled n times, from which at least one skeleton corresponding to a decipherable pattern is extracted. Coordinate values of at least one pixel of each skeleton are respectively enlarged ntimes and used as the central points on the original image plane for establishing a plurality of detecting blocks with the identical size. Subsequently, a grading mechanism is employed to determine the corresponding detecting blocks of the decipherable pattern.

Method for fast locating decipherable pattern

Growing community of inventors

Keelung, Taiwan

Chun-Shun Tseng