Apple Inc.

Chun-Lung Chen

Boon Wai Shiu

Robert W Schlub

Mattia Pascolini

Jerzy S Guterman

Erdinc Irci

Joshua G Nickel

Ruben Caballero

Yi Jiang

Indranil S Sen

Nicholas George Merz

Erica J Tong

Tseng-Mau Yang

Joss Nathan Giddings

Jonathan M Haylock

Diego C Hernandez

Javier Gomez Tagle

Hagan O'Connor

An electronic device may be provided with wireless circuitry that includes antennas. An antenna may be formed from metal traces on a dielectric antenna carrier. The antenna carrier may be formed by molding a layer of plastic onto the surface of a foam member. The foam member may have a low dielectric constant to enhance antenna performance and may be formed from a stiff closed cell plastic foam material. Heat and pressure may be used to attach the layer of plastic to the surface of the foam member without adhesive. A laser may be used to selectively expose portions of the plastic layer to laser light. The plastic layer may include additives that sensitize the plastic layer to light exposure. Electroplated metal traces for the antenna may be formed on the exposed portions of the plastic layer while leaving other portions of the plastic layer uncovered with metal.

Electronic device antennas with laser-activated plastic and foam carriers

Electronic devices may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may include a dielectric carrier such as a foam carrier. The foam carrier may be formed from a material that can withstand elevated temperatures. Metal traces for antennas can be formed on the foam carrier by selectively activating areas on a powder coating with a laser and plating the laser-activated areas. Metal for the antennas may also be formed by attaching layers such as flexible printed circuit layers and metal foil layers to the foam carrier. Solder may be used to attach a coaxial cable or other transmission line, electrical components, and other electrical structures to the metal antenna structures on the foam carrier. The foam carrier may be formed from open cell or closed cell foam. The surface of the foam may be smoothed to facilitate formation of metal antenna structures.

Electronic device with foam antenna carrier

An antenna with a curved shape may be mounted behind a curved antenna window. The antenna may have an antenna resonating element such as an inverted-F antenna resonating element and may have an antenna ground. The antenna resonating element may be formed from patterned metal traces on a flexible printed circuit. The flexible printed circuit may have ground traces that run along a peripheral edge of the flexible printed circuit. The antenna ground may be formed from a metal can with walls surrounding a cavity having an opening. The metal can may have a lip formed from bent portions of the walls. The flexible printed circuit may be soldered to the lip so that the ground traces are shorted to the can. A cable connector may be mounted on a bent tab in the flexible printed circuit that extends through a notch in the lip.

Cavity antennas with flexible printed circuits

Damage to conductive material that serves as bridging connections between conductive structures within an electronic device may result in deficiencies in radio-frequency (RF) and other wireless communications. A test system for testing device structures under test is provided. Device structures under test may include substrates and a conductive material between the substrates. The test system may include a test fixture for increasing tensile or compressive stress on the device structures under test to evaluate the resilience of the conductive material. The test system may also include a test unit for transmitting RF test signals and receiving test data from the device structures under test. The received test data may include scattered parameter measurements from the device structures under test that may be used to determine if the device structures under test meet desired RF performance criteria.

Methodology and apparatus for testing conductive adhesive within antenna assembly

A test system may include a master test station and slave test stations. The test stations may receive devices under test such as portable wireless electronic devices. Each test station may have adjustable antenna structures coupled to test equipment. The adjustable antenna structures may include antenna support structures on which test antennas are mounted and rail along which the antenna support structures and test antennas are moved by a pneumatic positioner. A rotatable platform may be provided in each test station to support the device under test in that test station. By making a series of over-the-air test measurements in the master test station while adjusting the antenna system and device positioning system, a satisfactory location for the active test antenna and device position may be identified. This configuration may then be used in performing single-point over-the-air tests in the slave test stations.

Test system having test stations with adjustable antennas

Electronic device structures may be tested using a radio-frequency test system. The radio-frequency test system may include radio-frequency test equipment and an associated test fixture. The radio-frequency test equipment may be used in generating and measuring radio-frequency signals. The test fixture may contain adjustable structures that allow the positions of radio-frequency test probes to be adjusted. The test system may be configured to position radio-frequency probes in the test fixture so that some probe contacts form electrical connections with conductive antenna structures. The radio-frequency probes may contain other contacts that are positioned to form electrical connections with conductive electronic device housing structures. During radio-frequency testing, the test equipment in the test system may apply radio-frequency test signals to the device structures under test using the test probes. Corresponding radio-frequency test signals may be measured by the test equipment.

Test system with adjustable radio-frequency probe array

A test system may include a wireless test chamber with metal walls lined with pyramidal absorbers. A trapdoor may be provided in a wall opening to accommodate a robotic arm. The robotic arm may have grippers that grip a device under test or a support structure that is supporting a device under test. The robotic arm may move the device under test to a docking station for automatic battery charging during testing. When it is desired to perform wireless tests on a device under test, the robotic arm may move the device under test through the trapdoor into an interior portion of the test chamber. A turntable and movable test antenna may be used to rotate the device under test while varying angular orientations between test antenna and device under test. Emitted radiation levels can be measured using a liquid filled phantom and test probe on a robotic arm.

Robotic wireless test system

An electronic device may have a housing in which an antenna and a proximity sensor formed from flex circuit structures are mounted. The flex circuit structures may include first and second flex circuit layers. The first and second flex circuit layers may include metal antenna structures and metal proximity sensor electrode structures. Solder may be used to attach electrical components to the flex circuit layers and may be used to electrically connect metal structures on the first and second flex circuit layers to each other. The first and second flex circuit layers may be laminated together using a compressive fixture. The compressive fixture may have a first fixture with a convex surface and a second fixture with a concave surface so that the laminated flex circuit layers are provided with a bend.

Growing community of inventors

Sunnyvale, CA, United States of America

Chun-Lung Chen