Finisar Corporation

Emcore Corporation

Chun Lei

Robert Shih

John Chen

Andreas G Weber

Jan Lipson

John Hsieh

Anthony Ho

Yew-Tai Chieng

Song Miao

Alex Klajic

Jeff Price

Raj Cornelius

Hongyu Deng

Richard F Carson

Nein-Yi Li

Chuan Xie

A vertical surface emitting laser having a mesa structure formed with sloping side walls. A passivation layer including at least two sublayers at least partially covers the mesa structure. The at least two sublayers have differing stress components arranged to at least partially counter each other. By making the mesa structure with sloping side walls, the deposition of the passivation layer in such a way as to minimize the net stress of the passivation layer is facilitated. In addition, the mesa structure has a first stack of mirror layers comprising a semiconductor material doped with a first dopant and having first peripheral oxidized portions extending a first distance into said first stack, and a second stack of mirror layers comprising a semiconductor material doped with a second dopant and having second peripheral oxidized portions extending a second distance into said second stack, wherein the first distance is different from the second distance. By controlling the first distance and the second distance appropriately, the internal stress in the mesa structure can be reduced.

VCSEL semiconductor device

A photonic device package with a passively aligned lens cap is disclosed. The lens cap is positioned with an unobstructed view of the lens portion of the lens cap. A header holding a photonic device, is moved relative to the cap or vice versa until the video display system indicates that the photonic device is aligned to the lens. The cap is held in alignment by forming at least one weld point between the cap and the header. A subsequent hermetic sealing process can be used to permanently seal the cap to the header.

Photonic device package with aligned lens cap

This disclosure concerns systems, methods and devices for temperature-based control of laser performance. One example of a method is performed in connection with a laser of an optoelectronic transceiver. In particular, the laser is operated over a range of temperatures and the optical output of the laser is monitored. During operation of the laser, the bias current and current swing supplied to the laser are adjusted to the extent necessary to maintain a substantially constant optical output from the laser over the range of temperatures.

Systems, devices and methods for temperature-based control of laser performance

A semiconductor laser formed from a semiconductor wafer has an active layer, at last two optical cladding layers, and a ridge waveguide. A ridge top surface of the ridge waveguide is deposited from a first surface of the semiconductor laser wafer by a first height. A plurality of semiconductor mesas are formed on the semiconductor laser wafer and have mesa top surfaces disposed from the first surface by a second height greater than the first height so that the plurality of semiconductor mesas shield the ridge waveguide from mechanical damage.

Epitaxial layer for laser diode ridge protection

An apparatus for stacking photonic devices is disclosed. The apparatus can include a base, first and second spaced apart rail portions disposed on the base, and a vacuum guide disposed on the base between the rail portions for forming a vacuum gradient that pulls a plurality of photonic devices and spacer bars together into a stack. Optionally, spaced apart photonic device supports can be placed on the base between the rail portions to lift the photonic devices off of the surface of the base. The apparatus can also include a clamping system to hold the stack in place so that a vapor deposition process can be used to apply coatings to the photonic devices. In one exemplary embodiment, the photonic devices can be laser bars.

Apparatus and method for stacking laser bars for uniform facet coating

A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.

Laser production and product qualification via accelerated life testing based on statistical modeling

A method of maintaining desirable optical performance of optical emitters over temperature variations is disclosed. The optical performance of an optical emitter in terms of power, extinction ratio, jitter, mask margin and general fiber optic transmitter eye quality can be maintained by the present invention over a wide range of temperatures. Advantageously, the present invention enables the use of inexpensive optical emitters in optoelectronic transceivers and optoelectronic transmitters.

Maintaining desirable performance of optical emitters over temperature variations

A die having at least one opto-electronic device disposed on a front-side of the die has its backside mounted to a submount with the backside positioned to align the front-side opto-electronic devices with respect to the submount. A first set of alignment features are formed on the backside of the die which are aligned to the front-side. The first set of a alignment features is then aligned to a second set of alignment features disposed on the submount and the backside is bounded into place.

Growing community of inventors

Los Gatos, CA, United States of America

Chun Lei