Taiwan Semiconductor Manufacturing Comp. Ltd.

Au Optronics Corporation

National Yang Ming Chiao Tung University

Nuworld Corporation

Chun-Hsien Lin

Jong-I Mou

Sunny Wu

Henry Lo

Jo Fei Wang

Francis Ko

Jean Wang

Yen-Di Tsen

Bing-Fei Wu

Meng-Liang Chung

Kewei Zuo

Keung Hui

Heng-Hsin Liu

Jyh-Cherng Sheu

Yu-Liang Lin

Chih-Wei Lai

Andy Tsen

Ping-Hsu Chen

Jui-Long Chen

Po-Wei Huang

Kuo-Hung Chao

Hsueh Chi Shen

Amy Wang

Ming-Feng Yoo

Chin-Shun Chen

Chin-Hsiang Lin

Li-Jui Chen

Chih-Wei Hsu

Mei Sheng Zhou

Cheng-Lin Huang

Chung-Long Chang

Yi-Ming Dai

Fei-Gwo Tsai

Jui-Chun Peng

Chia-Hung Huang

Yu-Jen Cheng

Ai-Sen Liu

Chien-Ko Liao

Yi-Ping Hsieh

Chih-Liang Pan

Shin-Rung Lu

Pei-Yi Su

Chi-Chun Hsieh

Tsung-Hung Lee

Hui-yun Chao

Nan-Jung Chen

Jia-Hua Hong

Kai-Yuan Siao

Wen-Pin Liu

Yi-Chiao Wu

Bing-Jhang Wu

Tien-chin Huang

Hsien-Mao Huang

Liu Bo-Tsun

Chih-Cheng Huang

Tzu-Min Lin

I-Ching Chu

Shun-Ping Wang

Gorge Huang

Tony Lu

Candy Liang

Sunny Su

Shuh-Chwen Yeh

Ai-Sen Lui

Anthony Liu

Shih Che Wang

Chia-Feng Liao

Chung-Hsing Lee

Chun-Yung Chang

Pei-Yuan Wu

Gnesh Yeh

Chin-Ti Ko

Wu Cheng-Hung

Jung-Hsi Hsieh

Peng Jui-Chun

Kuo-Hsiang Chien

Kun-Ming Chen

Dung-Yian Hsieh

Hui-Ru Lin

A people-flow analysis system includes an image source, a computing device, and a host. The image source captures a first image and a second image. The computing device is connected to the image source. The computing device identifies the first image according to a data set to generate a first detecting image. The first detecting image has a position box corresponding to a pedestrian in the first image. The computing device generates a tracking image according to the data set and a difference between the first detecting image and the second image. The tracking image has another position box corresponding to a pedestrian in the second image. The host is connected to the computing device and generates a people-flow list according to the first detecting image and the tracking image.

People-flow analysis system and people-flow analysis method

The invention is related to a method of three-dimensional face reconstruction by inputting a single face image to reconstruct a three-dimensional face model, therefore, the human face image is seen at various angles of three-dimensional face through rotating the model images.

Three-dimensional human face reconstruction method

The present invention provides a contactless-type sport training monitor method, comprising: selecting at least an image database to recognize a plurality of expressions in the image database; making pre-processing for the plurality of expressions: using a convolutional neural network as a feature point extraction model; acquiring a human image; tracking a first target region and a second target region in the human image; making chrominance-based rPPG trace extraction; using the deep level model to compare the second target region image; and to calculate a post-exercise heart rate recovery achievement ratio, to judge the Rating of Perceived Exertion, and judging whether the human body is under overtraining status or not.

Contactless-type sport training monitor method

A facial expression recognition training system includes a training module, feature database, a capturing module, a recognition module and an adjusting module. The training module trains a facial expression feature capturing model according to known face images. The feature database stores known facial expression features of the known face images. The capturing module continuously captures first face images, and the facial expression feature capturing model outputs facial expression features of the first face images according to the first face images. The recognition module compares the facial expression features and the known facial expression features, and fit the facial expression features to the first known facial expression features that is one kind of the known facial expression feature accordingly. The adjusting module adjusts the facial expression feature capturing model to reduce the differences between the facial expression features and the known facial expression features.

Facial expression recognition training system and facial expression recognition training method

A sexual stimulating system with feedback control includes a physiological sensor, a sexual stimulator, and a processing module. The physiological sensor measures a physiological response of a user under sexual stimulation, and generates a sensor signal according to a result of the measurement of the physiological response. The sexual stimulator applies the sexual stimulation. The processing module is electrically connected to the physiological sensor and the sexual stimulator, receives the sensor signal, performs an analytical procedure upon the sensor signal for generating digital data, and generates a driving signal according to the digital data to control a degree of the sexual stimulation.

Sexual stimulating system and method with feedback control

A photolithography tool includes at least one process chamber, at least one front opening unified pod (FOUP) stage, at least one moving mechanism, and an image sensor. The moving mechanism is configured to move the wafer from the process chamber to the FOUP stage. The image sensor is configured to capture the image of the wafer on the moving mechanism.

Photolithography tool and method thereof

A temperature controlled loadlock chamber for use in semiconductor processing is provided. The temperature controlled loadlock chamber may include one or more of an adjustable fluid pump, mass flow controller, one or more temperature sensors, and a controller. The adjustable fluid pump provides fluid having a predetermined temperature to a temperature-controlled plate. The mass flow controller provides gas flow into the chamber that may also aid in maintaining a desired temperature. Additionally, one or more temperature sensors may be combined with the adjustable fluid pump and/or the mass flow controller to provide feedback and to provide a greater control over the temperature. A controller may be added to control the adjustable fluid pump and the mass flow controller based upon temperature readings from the one or more temperature sensors.

Temperature controlled loadlock chamber

Among other things, systems and techniques are provided for detecting defects on a wafer based upon non-correctable error data yielded from a scan of the wafer to determine a topology of the wafer. The non-correctable error data is reconstructed to generate a non-correctable error image map, which is transformed to generate a projection. In some embodiments, the non-correctable error image map is transformed via a feature extraction transform such as a Hough transform or a Radon transform. In some embodiments, the projection is compared to a set of rules to identify a signature in the non-correctable error image map indicative of a defect.

Detection of defects on wafer during semiconductor fabrication

A light emitting diode (LED) string driving method applicable to drive a driving circuit is provided. The driving circuit comprises a plurality of LED strings, a power supply unit electrically coupled to the LED strings, a comparison unit configured to receive an input voltage, a control unit electrically coupled to the comparison unit, and a switch unit electrically coupled to the control unit, the power supply unit and the LED strings. The driving method comprises configuring the comparison unit to output a first control signal to the control unit through comparing the input voltage to the predetermined voltage, configuring the control unit to output a second control signal to the switch unit according to the first control signal, and configuring the switch unit to form various electrical loops and configuring the LED strings to corporately form either a parallel loop or a series loop via respective electrical loops.

Light emitting diode string driving method

A method for analyzing abnormalities in a semiconductor processing system provides performing an analysis of variance on a production history associated with each of a plurality of tools at each of a plurality of process steps for each of a plurality of processed wafers, and key process steps are identified. A regression analysis on a plurality of measurements of the plurality of wafers at each process step is performed and key measurement parameters are identified. An analysis of covariance on the key measurement parameters and key process steps, and the key process steps are ranked based on an f-ratio, therein ranking an abnormality of the key process steps. Further, the plurality of tools associated with each of the key process steps are ranked based on an orthogonal t-ratio associated with an analysis of covariance, therein ranking an abnormality each tool associated with the key process steps.

2D/3D analysis for abnormal tools and stages diagnosis

An embodiment is a method for semiconductor processing control. The method comprises identifying a key process stage from a plurality of process stages based on a parameter of processed wafers, forecasting a trend for a wafer processed by the key process stage and some of the plurality of process stages based on the parameter, and dispatching the wafer to one of a first plurality of tools in a tuning process stage. The one of the first plurality of tools is determined based on the trend.

Semiconductor processing dispatch control

A display apparatus and an operation method thereof are provided. The display apparatus includes a display panel. The display panel includes a plurality of data lines, a plurality of scan lines and a plurality of pixels. The pixels are arranged in a matrix manner, and each pixel is electrically connected to one of the data lines and one of the scan lines. The operation method includes steps of: dividing the scan lines into N scan line groups, wherein N is an integer from 2 to the number of the scan lines; and in N frame periods sequentially driving the N scan line groups of scan line respectively and thereby sequentially updating display data of the pixels electrically connected to the N scan line groups of the scan line respectively.

Partially-driven display apparatus

The present disclosure relates to a method of monitoring wafer topography. A position and orientation of a plurality first alignment shapes disposed on a surface of a wafer are measured. Wafer topography as a function of wafer position is modeled by subjecting the wafer to an alignment which simultaneously minimizes misalignment between the wafer and a patterning apparatus and maximizes a focus of radiation on the surface. A non-correctable error is determined as a difference between the modeled wafer topography and a measured wafer topography. A maximum non-correctable error per field is determined for a wafer, and a mean variation in the maximum non-correctable error across each field within each wafer of a lot is determined, both within a layer and across layers. These values are then verified against a set of statistical process control rules to determine if they are within a specification limit of the manufacturing process.

Overlay abnormality gating by Z data

A LED string driving circuit includes a plurality of LED strings; a power supply unit configured to receive an input voltage and accordingly output a driving voltage to the LED strings; a comparison unit configured to receive the input voltage and output a first control signal according to a relationship between the input voltage and a predetermined voltage; a control unit configured to receive the first control signal and generate a second control signal according to a potential level of the first control signal; and a switch unit including a plurality of switch elements, and each are controlled by the second control signal and thereby forming various electrical loops and thereby configuring the LED strings corporately to form either a parallel loop or a series loop via the switch unit with respective electrical loops. A LED string driving method is also provided.

Light emitting diode driving circuit and driving method thereof

Growing community of inventors

Hsin-Chu, Taiwan

Chun-Hsien Lin