Finetek Co., Ltd.

Chun-Han Huang

I-Chu Lin

Yi-Liang Hou

Liang-Chi Chang

Wei-Yu Chen

Shih-Wei Lu

A method of processing FMCW radar signal retrieves a configuring parameter set () corresponding to a working environment or a detected material, receives a reflection time-domain signal, executes a time-domain-to-frequency-domain converting process to the reflection time-domain signal for obtaining a reflection frequency-domain signal, executes the corresponded process on the reflection frequency-domain signal according to the configuring parameter set (), and analyzes the processed reflection frequency-domain signal and generates a detecting result. The present disclosed example can effectively reduce the time of the development and the cost of manufacture via executing the corresponded process according to the configuring parameter set () corresponding to the working environment or the detected material.

Method of processing FMCW radar signal

A probe () of a material level measuring apparatus () inserts into a container (). The material level measuring apparatus () transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t) and a second time-passing difference value (t) are obtained. According to the first time-passing difference value (t), the second time-passing difference value (t) and a predetermined empty container time-passing difference value (t), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.

Method for measuring level of material level measuring apparatus

A material level indicator includes a probe, first and second signal compensating units, arranged at first and second ends of the probe respectively, and a controlling module arranged at the first end and includes a signal processor, a signal emitter, and a signal receiver. The second end is opposite to the first end. The signal processor is connected to the signal emitter and the signal receiver. The signal emitter emits an electromagnetic signal from the first end to the second end of the probe. The first and second signal compensating units reflect the electromagnetic signal, and the signal processor generates first and second time interval differences according to the reflected electromagnetic signal received by the signal receiver. The signal processor calibrates an environmental coefficient and indicates a dielectric coefficient of the material according to the first and second time interval differences respectively.

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Taipei, Taiwan

Chun-Han Huang